1) Artículos Indexados
2) Conferencias
3) Libros
4) Artículos de Revisión Bibliográfica
5) Patentes
6)Presentaciones Invitadas
7) Notas Periodísticas |
1.Artículos Indexados
(84) Fanny Moses Gladys, Masaru Matsuda, Yiheng Lim, Boaz Jessie Jackin,
Takuto Imai, Yukitoshi Otani, Toyohiko Yatagai and Barry Cense : Developmental
and morphological studies in Japanese medaka with ultra-high resolution
optical coherence tomography, Biomedical Optics Express, 6, 2, pp.297-308
(2015)
(83) David-Ignacio Serrano-García, Amalia Martinez-García,Noel-Iván Toto-Arellano,
Yukitoshi Otani : Single shot interferometry using a two-interferogram
phase shifting algorithm, Advanced Optical Technologies,3, 4 (2014) pp.401–406,
(82) Hayato Ohashi, Takeshi Higashiguchi, Yuhei Suzuki, Goki Arai,Yukitoshi
Otani, Toyohiko Yatagai, Bowen Li, Padraig Dunne, Gerry O’Sullivan, Weihua
Jiang, Akira Endo, Hiroyuki A. Sakaue, Daiji Kato, Izumi Murakami, Naoki
Tamura, Shigeru Sudo, Fumihiro Koike, and Chihiro Suzuki : Quasi-Moseley’s
law for strong narrow bandwidth soft x-ray sources containing higher charge-state
ions, APPLIED PHYSICS LETTERS 104, 234107 (2014) pp.234107-1 -234107-5.
（81）David Ignacio Serrano-García, Amalia Martínez-García, Noel-Ivan Toto-Arellano,
Yukitoshi Otani: Dynamic temperature field measurements using a polarization
phase-shifting technique, Optical Engineering, 53, 11 (2014) 112202-112202.
（80） Toshitaka Wakayama,Oscar G. Rodríguez-Herrera, J. Scott Tyo, Yukitoshi
Otani, Motoki Yonemura, and Toru Yoshizawa : Generation of achromatic,
uniform-phase, radially polarized beams,Optics Express 22, 1 (2014) pp.3306-3315.
（79) Takashi Onuma, Yukitoshi Otani : A development of two-dimensional
birefringence distribution measurement system with a sampling rate of 1.3
MHz, Optics Communications, 315,15(2014) 69–73．
（78) Yuki Nagata, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani :Photothermal
Imaging for Single Nanoparticle Using Single Element, Interferometer International
Journal of Optomechatronics,7,2 (2013) 96–104.
（77）Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani:All
polarization properties of PLZT ferroelectric ceramics observed in two
dimensional distributions under applied voltage by the Mueller matrix,
Sensors and Actuators A: Physical, 200 (2013) 37-43.
（76）Toshitaka Wakayama, Kazuki Komaki, Yukitoshi Otani, Toru Yoshizawa : Achromatic axially symmetric wave plate, Optics Express,
20, 28 (2012) pp.29260–29265.
（75）大沼隼志,大谷幸利：サブミリ秒の時間分解能をもつ動的 2 次元複屈折計測装置の開発，精密工学会誌．78.12 (2012) 1082-1086.
（74）Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa : Projection type of moiré topography with frequency modulation technique using liquid crystal digital gratings, Optical Review, (2012) pp.154-158
（73）田中政之介，中島吉則，雨宮秀行，大谷幸利：液晶位相変調器を用いたストークス偏光計，光学，41,3 (2012) pp.149-157．
（72）Ryoichi KUWANO, Toshihiko KOGA, Tsuyoshi TOKUNAGA, Toshitaka WAKAYAMA,
Yukitoshi OTANI, Nobuyuki FUJII : Ring Beam Shaping Optics Fabricated with Ultra-precision
Cutting for YAG Laser Processing, Optical Review, (2012).
(71) Yasuhiro Mizutani, Akihiro Tsutsumi, Tetsuo Iwata, Yukitoshi Otani : Optically driven method for magnetically levitating diamagnetic material
using photothermal effect, JOURNAL OF APPLIED PHYSICS 111, pp.023909-1
- 023909-5 (2012).
（70）Takayuki Higuchi, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani : Stroboscopic oblique-incidence interferometer for motion visualization of stator of ultrasonic motor, Physics Procedia 19 (2011) 82–87.
（69）Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani : Polarization properties of PLZT under applied voltage measured by dual-rotating
retarder polarimeter, Physics Procedia 19 (2011) 398–402.
（68）田中政之介，中條 充，中島吉則，雨宮秀行，大谷幸利：2重回転分光ストークスポラリメータの開発と液晶セルの特性評価，光学，40,8 (2011) ．
（67）田中政之介，中島吉則，雨宮秀行，若山俊隆，大谷幸利：液晶偏光変調器を用いた旋光計測装置の開発，光学，40,7 (2011) pp.350-356．
（66）小林富美男，大谷幸利，吉澤徹：デジタル液晶変調器による格子投影型モアレ三次元次元計測，精密工学会誌．76.10 (2010) 1031-1035.
（65）N. Ghosh, Y. Otani, K. Bhattacharya : Generation of collinearly propagating
orthogonally polarized beam, Optik - Int. J. Light Electron Opt. (2010),
doi:10.1016
（64）Yasuhiro Mizutani, Yukitoshi Otani, and Norihiro Umeda:
“Optically-driven Micromanipulator for Three-dimensional Fabrications,”
International Journal of Optomechatronics, 3, 1: (2009) 18?29.．
（63）加藤波里，若山俊隆，大谷幸利：分光偏光変調を用いた複屈折および旋光同時計測法，光学，37,11 (2008)
pp.657-664．
（62）Yukitoshi Otani, Toshitaka Wakayama, Kazuhiko Oka,
Norihiro Umeda : Spectroscopic Mueller matrix polarimeter using four-channeled
spectra, Optics Communications, 281 (2008) 5725?5730．
（61）Yasuhiro Mizutani, Yukitoshi Otani, Norihiro Umeda :
Optically driven actuators using Poly(vinylidene difluoride), Optical Review,
15, 3 (2008) 162 - 165.
（60）Toshitaka Wakayama,Yukitoshi Otani, Norihiro Umeda :
One-shot birefringence dispersion measurement based on channeled spectrum
technique, Optics Communications, 281, 14 (2008) 3668?3672.
（59）Yasuhiro Mizutani, Mizue Ebisawa, Yukitoshi Otani,
Norihiro Umeda: “Optically 3D Controlled Magnetic Levitation Using Temperature
Sensitive Ferrite,” Jpn. J. Appl. Phys., 47, pp. 3461-3465 (2008).
（58）Yasuhiro Mizutani, Yukitoshi Otani, Norihiro Umeda :
Optically controlled bimorph cantilever of Poly(vinylidene difluoride), Applied
Physics Express, 1 (2008) 041601-1 - 041601-3.
（57）Numata, T., Otani.Y., Umeda, N. : Meso-porous membrane of
noble metal for surface plasmon resonance gas sensors, Journal of Materials
Science, 42 (3), (2007) pp. 1050-1053.
（56）Nishiyama, I., Yoshida, N., Otani.Y., Umeda, N. : Direct
alignment of liquid crystal molecules using an atomic force microscope, Japanese
Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review
Papers, 46 (2), (2007) pp. 729-731
（55）沼田孝之，岩崎吉朗，大谷幸利，梅田倫弘：表面プラズモン共鳴を用いた光タクタイル圧力センサ，電気学会論文誌E（センサ・マイクロマシン），92,
127 (3) (2007) pp.192-193.
（54）Nishiyama, I., Yoshida, N.,Otani.Y., Umeda, N. :
Single-shot birefringence measurement using radial polarizer fabricated by
direct atomic force microscope stroking method, Measurement Science and
Technology, 18 (6) (2007) pp.1673-1677.
（53）西山 達，保坂佳正，大谷幸利，梅田倫弘：液晶位相格子を用いた光制御 ― 光熱スイッチの開発，電気学会論文誌（電子・情報・システム部門誌），127-Ｃ，６ (2007) 966-
967.
（52）Mizue Ebisawa, Yukitoshi Otani Norihiro Umeda : Mechanical
characterization measurement of polymer material under stress by birefringence
microscope, Optical Review, 14,5 (2007) 310-313.
（51）Takayuki Numata, Hirokazu Tatsuta, Yoshiaki Morita, Yukitoshi
Otani and Norihiro Umeda : Localized thermal processing with a laser-trapped
and heated metal nanoparticle, Transactions on Electrical and Electronic
Engineering, 2 (2007)398-401.
（50）海老澤瑞枝，酒井洋平，大谷幸利，梅田倫弘：微小レンズの2次元複屈折分布計測，精密工学会誌,73,
3(2007)389-392．
（49）Takayuki Numata, Yukitoshi Otani and Norihiro Umeda :
Optical Dew Sensor Using Surface Plasmon Resonance of Periodic Ag Nanostructure,
Japanese Journal of Applied Physics,45, 30, pp.L810-813 (2006).
（48）Numata, T., Otani.Y., Umeda, N. : Optical dew sensor using
surface plasmon resonance of periodic Ag nanostructure, Japanese Journal of
Applied Physics, Part 2: Letters, 45 (29-32), (2006) pp. L810-L813.
（47）Qin, J., Nagai, H., Numata, T., Otani.Y, ., Umeda, N. :
Observation of 3-D birefringence distribution of polymer thin film by near-field
optical microscope , Journal of Physics: Conference Series, 48 (1), 175 (2006),
pp. 926-931.
（46）海老澤瑞枝，佐久間淳，大谷幸利：生体軟組織の引張変形過程における細胞内ひずみ分布の複屈折顕微鏡による観察，日本機械学会誌,72,
724（2006）2079-2085．
（45）水谷康弘，桑野亮一，大谷幸利，梅田倫弘，吉澤 徹：可変焦点レンズを用いたフォーカス法による三次元形状計測，精密工学会誌,72,
9 (2006) 1152-1156．
（44）T.Wakayama, Y.Otani, N.Umeda : Birefringence dispersion
measurement based on achromatic four points of geometric phase, Optical
Engineering,, 45, 8 (2006) 083603．
（43）若山俊隆，大谷幸利，梅田倫弘，黒川隆志：ライン型分光器による分光複屈折計測，精密工学会誌，72,5 (2006)
602-606.
（42）水谷康弘，大谷幸利，梅田倫弘：感温磁性体による光熱変換方式2次元アクチュエータ，電気学会論文誌E,126, 4
(2006)170-171．
（41）T.Wakayama, H.Kowa, Y. Otani, , N.Umeda : Two-dimensional
measurement of birefringence dispersion using spectroscopic polarized light,
Optical Engineering, 45, 033601 (2006)．
（40) Takayuki Numata, Atsuo Takayanagi, Yukitoshi Otani, ,
Norihiro Umeda : Manipulation of metal nanoparticles using fiber-optic laser
tweezers with a microspherical focusing lens, Jpn. J. Appl.Phy., 45, 1A (2006)
359-363.
（39）若山俊隆，大谷幸利，梅田倫弘：分光偏光変調による旋光分散計測，光学,35,1（2006）31-36．
（38）Ryoichi Kuwano, Tsuyoshi Tokunaga, Yukitoshi Otani, , Norihiro Umeda
: Beam Shaping Optics for YAG Laser by Using CNC Lathe, Optical Review,12, 6
(2005) 476-479．
（37）R.Kuwano T.Tokunaga, Y. Otani, , N.Umeda : Liquid pressure
varifocus lens, Optical Review, 12, 5 (2005) 405-408.
(36）Alexander V. Tavrov, Yosuke Kobayashi, Yosuke Tanaka, Tatsutoshi
Shioda, Yukitoshi Otani, Takashi Kurokawa, M.Takeda : Common-path
achromatic interferometer-coronagraph: nulling of polychromatic light, Optics
Letters, 30, 17 (2005) 2224-2226
（35）Lianhua Jin, Kuniharu Takizawa, Yukitoshi Otani, and Norihiro
Umeda : Multi-wavelength Mueller matrix polarimeter, Optical Review, 12, 4
(2005) 281-286.
（34）海老澤瑞枝，大谷幸利，梅田倫弘：顕微鏡型複屈折マッピングシステム，精密工学会誌，70, 6（2004）．
（33）Lianhua Jin, Takayuki Hamada, Yukitoshi Otani, Norihiro Umeda :
Measurement of characteristics of magnetic fluid by the Mueller matrix imaging
polarimeter, Optical Engineering,,42, 1 (2004) 181-185
（32）Shinya Okubo, Shohei Yamazaki, Atsuo Takayanagi, Yukitoshi Otani,
Norihiro Umeda :Shear-force detection by reusable quartz tuning fork without
external vibration, Optical Review, 10, 2 (2003) 128-130.
（31）Shinya Okubo, Yukitoshi Otani, Norihiro Umeda :Electromagnetic field
analysis for circulary polarized light at apex of the near field probe,
Jpn.J.Appl.Phy., 42 (2003)L297-L300.
（30）若山俊隆, 高和宏行, 大谷幸利, 梅田倫弘,
吉澤徹：波長依存性を考慮した２次元複屈折計測，光学，31，11（2002）826-831
（29）L.H.Jin, T.Yoshizawa, Y.Otani : Fringe scanning moire by means frequency
modulation technique, Optical Engineering, 40,
7（2001）1383-1386.
（28）山谷謙，山本将之，藤田宏夫，勝呂彰，大谷幸利，諸川滋，吉澤徹：液晶格子パターンによる３次元形状計測，精密工学会誌，67, 5（2001）786-790．
（27）M.I.Shribak, Y.Otani, T.Yoshizawa : Autocollimation polarimeter for
measuring two-dimensional distribution of birefringence, Journal Optics &
Spectroscopy", 89,1 (2000) 155-159.
（26）L.H.Jin, Y.Kodera, T.Yoshizawa, Y.Otani : Shadow moire profilometry using
phase-shifting method, Optical Engineering ,39,8 (2000)
2119-2123．
（25）小田 功，大谷幸利，リレンリュウ，吉澤徹：Cu:KNSBN結晶のフォトリフラクティブ二光波混合によるパターンマッチング，
光学，29，1（2000）33-38．
（24）殿岡雅仁，
山本将之，大谷幸利，吉澤徹，石原満宏，中里康生，佐々木博美：格子パターン投影法を用いた位相およびコントラスト検出による表面形状計測，精密工学会誌，66,
1（2000）132-136
（23）小寺豊，金蓮花，大谷幸利，吉澤徹：位相シフト実体格子型モアレ法による形状計測，精密工学会誌，65,
10（1999）1456-1460．
（22）山本将之，殿岡雅仁，大谷幸利，吉澤 徹，天野覺：格子パターン投影法を用いた反射物体の表面形状計測（第2法）-
楕円面鏡の計測，精密工学会誌，65,8（1999）1111-1115．
（21）福島健一，大谷幸利，吉澤 徹：圧電素子と感温フェライトからなる光駆動走行マシン，精密工学会誌，64，10 (1998)
1512-1516．
（20）桑原豊明，大谷幸利，吉澤 徹：ワンステップ位相シフト法を用いたアブラムソン干渉計による表面形状計測，精密工学会誌，64，9 (1998)
1380-1384．
（19）山本将之，殿岡雅仁，大谷幸利，吉澤 徹：格子パターン投影法を用いた反射物体の表面形状計測，精密工学会誌，64，8 (1998)
1171-1175．
（18）I.Oda, Y.Otani, L.Liu, T.Yoshizawa : Vibration detection using moving
grating technique in photorefractive two-wave mixing, Japanese Journal of
Applied Physics,37,part 1, 6A (1998) 3304-3308．
（17）森 洋篤，大谷幸利，吉澤徹：局所サンプリング位相シフト法を用いた表面形状計測，精密工学会誌，64，6（1998）856-860．
（16）I.Oda, Y.Otani, L.Liu and T.Yoshizawa : Polarization effect for vibration
detection using photorefractive two-wave mixing in KNSBN:Cu crystal, Optics
Communications, 148(1998)95-100.
（15）Y.Otani, N.Okuhara, T.Yoshizawa : Measurement of nonoptical surfaces for
determination of Poison's ratio by oblique incidence interferometry , Optical
Engineering, 37, 1 (1998) 261-265.
（14）小田
功，大谷幸利，リレンリュウ，吉澤徹：”フォトリフラクティブ二光波混合による干渉計の周波数応答”，光学，26，11（1997）593-598．
（13）Y.Otani, A.Tanahashi, T.Yoshizawa : " Light source with orthogonally
linear polarized two-frequency beam from laser diode and surface profile
measurement", Optical Engineering，35，4（1996）1070-1073.
（12）東根亜紀，大谷幸利，高和宏行，徳永剛，吉澤徹：”パターン投影法における縞次数の決定法とレンズ素材の形状計測ヘの応用”，精密工学会誌，61，12（1995）1701-1705．
（11）Y.Otani, T.Yoshizawa : "Two-dimensional magnetic field distribution
measurement using the birefringence effects of magnetic fluids", Optik , 100, 3
(1995) 133-136.
（10）大谷幸利，小田悦宏，井門
修，藤田宏夫，吉澤徹：”音響光学素子を用いた差動型光ヘテロダイン干渉法による３次元表面形状計測”，精密工学会誌，61，8（1995）1091-1094．
（９）棚橋昌史，大谷幸利，吉澤徹：”半導体レーザを用いた直交２周波光源の開発”，光学，23，12（1994）758-764．
（８）Y.Otani, T.Shimada, T.Yoshizawa : "The local-sampling phase shifting
technique for precise two-dimensional birefringence measurement", Optical Reviw
, 1, 1（1994）103-106.
（７）R.Gu, T.Yoshizawa, Y.Otani : " One-step phase shift 3-D surface
profilometry with grating projection", Optics and Lasers in Engineering，21，1-2
（1994 ）61-75.
（６）Y.Otani, T.Shimada, T.Yoshizawa, N.Umeda : "Two-dimensional Birefringence
Measurement using the Phase Shifting Technique", Optical Engineering,33,
5（ 1994 ）1604-1609.
（５）Y.Otani, T.Yoshizawa, A.Tanahashi : " Magnetostatic field measurement by optical heterodyne method with magnetic fluids", Optical Engineering, 33, 4（ 1994 ）1069-1073.
（４）大谷幸利，吉澤徹，押野則子：位相シフト型アブラムソン干渉計による粗面測定，精密工学会誌，60，3（ 1994）432-435．
（３）大谷幸利，棚橋昌史，吉澤徹：磁性流体を用いた磁場センシング，精密工学会誌，59，7（1993）1109-1113．
（２）大谷幸利，島田卓也，吉澤徹，梅田倫弘：位相シフト法による２次元複屈折分布測定，光学 21，10 （1992）682-687．
（１）吉澤徹，大谷幸利：サブミクロン感度をもつモアレトポグラフィ法，精密工学会誌 55，1（1989）152-154.
2.Conferencias
（1）Y.Otani, T.Shimada, T.Yoshizawa, N.Umeda : "Two-dimensional birefringence
measurement using the phase shifting technique", Proc. SPIE 1720(1992)
346-354.
（2）Y.Otani, T.Yoshizawa, A.Tanahashi : "Optical heterodyne measurement
of magnetic field using magnetic fluid", Proc. SPIE 1756 (1992)75-80.
（3）T.Yoshizawa, Y.Otani, A.Tochigi, T.Furuki : "Displacement measurement
by the detection of contrast variation of a projected pattern",Proc.SPIE
1756 (1992) 82-85.
（4）Y.Otani, T.Shimada, T.Yoshizawa : "The local-sampling phase shifting
technique for precise two-dimensional birefringence measurement"
, Frontiers in Information Optics, Topical Meeting of The International
Commission for Optics Meeting Digesat ( 1994 ) 178.
（5）N.Okuhara, R.Gu, Y.Otani, T.Yoshizawa : "Interference measurement
of nonoptical surface by one-step phase shifting technique", Frontiers
in Information Optics, Topical Meeting of The International Commission
for Optics Meeting Digesat ( 1994 ) 181.
（6）T.Yoshizawa, R.Komatsubara, Y.Otani, Y.Kawaguchi : "Non-contact
3D Measurement System for Assessment of Wrinkles", Optical Methods
in Bio-Medical and Environmental Sciences Third InternationalConference
of the International Society on Optics Within Life Sciences Absrtuct (1994
) 61.
（7）Y.Otani, T.Yoshizawa : "Polariscope using the Phase Shifting Technique",
Proc. SPIE Vol.2265, "Polarization Analysis and Measurement II"
( 1994 ) 54-61.
（8）Y.Otani, T.Yoshizawa : "Two-dimentional magnetic dield measuremnt
using the magnetooptic effects of magnetic fluids", Proc. SPIE Vol.2321
ICOESE'94 ( 1994 ) 9-15.
（9）T.Yoshizawa, R.Komatsubara, Y.Otani, Y.Kawaguchi : "Non-contact
3D Measurement System for Assessment of Wrinkles", Third International
Conference on Optics Within Life Sciences OWLS III (ELSERVIER, 1994 ) 129-132.
（10）Y.Otani, A.Tanahashi, T.Yoshizawa : " Light source with orthogonally
linear polarized two-frequency beam from laser diode and its applicatin",
Proc.SPIE Vol. 2576 (1995) 293-298.
（11）Y.Otani, T.Yoshizawa : "Measurement of two-dimensional birefringence
distribution for laser materials", Proc.SPIE "Polarization Analysis
and Applications to Device to Technology " Vol.2873 (1996) 160-163.
（12）I.Oda, Y.Otani, D.Just,L.Liu,T.Yoshizawa : "Vibration detection
using photorefractive two-wave mixing in KNSBN:Cu crystal and its polarization
effect", Proc. SPIE Vol.2873 (1996) 164-167.
（13）Y.Otani, N.Okuhara, T.Yoshizawa : " Nonoptical surface measurement
by oblique incidence interferometry" , Proc.SPIE Vol.2860 "Interferometry
VIII: Techniques and Analysis" Denver (1996) 302-305.
（14）Y.Otani, H.Mori, T.Yoshizawa : "Precise surface measurement by
local sampling phase shifting technique", Proc.SPIE Vol.2860 "Interferometry
VIII: Techniques and Analysis" Denver (1996) 122-125.
（15）H. Fujiwara, Y.Otani, T.Yoshizawa : " Flatness measrement by reflection
moire technique ", Proc.SPIE Vol.2862 "Flatness, Roughness, and
Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel
Displays" Denver (1996) 172-176.
（16）I.Oda, Y.Otani, D.Just, L.Liu and T.Yoshizawa : "Frequency Response
in Vibration Detection by Photorefractive Two-wave Mixing", 1996 International
Workshop on Interferometry, August (1996), Saitama 51-52.
（17）M.Yamamoto, Y.Otani, T.Yoshizawa : "Surface profile analysis using
oblique incidence interferometry", 1996 International Workshop on
Interferometry, August (1996), Saitama 131-132.
（18）Y.Otani, T.Nakano, T.Yoshizawa : "Optical heterodyne light source
using laser diodes and its application to hybrid measurement", Proc.SPIE
Vol.3098 "Optical Inspection and Micromeasurements"
Munich (1997) 294-298.
（19）Y.Otani , T.Kuwahara, T.Yoshizawa : Precise measurement of nonoptical
surface by oblique incidence interferometer, Proc.SPIE Vol.3478(1998) 214-217.
（20）H. Fujiwara, Y.Kodera, Y.Otani, T.Yoshizawa : Flatness measurement
by UV moire technique, Proc.SPIE Vol.3478 (1998) 444-447.
（21）K.Fukushima, Y.Otani, T.Yoshizawa : Optical driving of a miniature
machine consisting of piezoelectric elements and temperature-sensitive
ferrite, Proc.of China-Japan Bilateral Symposium on Advanced Manufacturing
Engineering (Press of Univ. of Science and Technology of China,
1998) 49-54.
（22）H.Mori, Y.Otani, T.Yoshizawa : Local sampling phase-shifting technique
for precise surface profile measurement, Proc.of China-Japan Bilateral
Symposium on Advanced Manufacturing Engineering (Press of Univ. of Science
and Technology of China, 1998)136-139.
（23）M.Ishihara, Y.Nakazato, H.Ssasaki, M.Tonooka, M.Yamamoto, Y.Otani,
T.Yoshizawa : Three-dimensional surface measurement using grating projection
method by detecting phase and contrast, Proc. ICOSN'99,
Yokohama (1999)114-117.
（24）L.H.Jin, Y.Kodera, T.Yoshizawa, Y.Otani : Shadow moire profilometry
using phase-shifting method, Proc. ICOSN'99, Yokohama (1999)110-113.
（25）K.Yamatani, M.Yamamoto, Y.Otani, T.Yoshizawa, H.Fujita, A.Suguro, S.Morokawa
: Three dimensional surface profilometry using structured liquid crystal
grating, Proc.SPIE Vol.3782, Denver (1999) 291-296.
（26）M.I.Shribak, Y.Otani, T.Yoshizawa : Return-path polarimeter for two
dimensional birefringence distribution measurement, Proc.SPIE,3754, Denver
(1999) 144-149.
（27）Y.Otani, H.Mori, T.Yoshizawa : Precise surface measurement by local
sampling phase shifting interferometry, 9th ICPE, Osaka(1999)342-347.
（28）H.Fujiwara, Y.Kodera, Y.Otani, T.Yoshizawa : Flatness measruement bi
moir・technique for large diameter wafer, 9th ICPE, Osaka (1999)348-353.
（29）M.I.Shribak, Y.Otani, T.Yoshizawa : Phase-shifting method for two dimensional
birefringence distribution measurement with return-path beams, Proc.SPIE
Vol.4148, Liviv, Ukraine (1999) 55-61.
（30）Y.Otani, N.Dushkina, T.Kannno, T.Yoshizawa : Disk inspection system
by two dimensional birefringence distribution measurement , Proc.SPIE Vol.4081,
Phonics Taiwan (2000) 17-20.
（31）T.Yoshizawa, T.Yamaguchi, M.Yamamoto, Y.Otani : Three dimensional profilometry
using moire pattern projection, Proc.SPIE, SanDiego (2000).
（32）H.Kowa, K.Muraki, Y.Otani, N.Umeda, T.Yoshizawa : High-order birefringence
measurement using spectroscopic polarized light, Proc.SPIE Vol.4133,San
Diego (2000).
（33）T.Yoshizawa, D.Hayashi, Y.Otani : Optical driving of a miniature walking
machine composed of temperature-sensitive ferrite and shape memory alloy,
Proc.SPIE Vol.4190 , Boston (2000).
（34）T.Yoshizawa, T.Shinoda, Y.Otani : Uni-axis range finder using contrast
detection of a projected pattern, Proc.SPIE Vol.4190 , Boston (2000).
（35）Y.Otani, K.Ishizauka, T.Kannno, T.Yoshizawa : Microscopic measurement
system for two dimensional birefringence distribution, Photonics 2000,
Calcutta, India (2000).
（36）T.Wakayama, H.Kowa, Y.Otani, N.Umeda, T.Yoshizawa: High-order birefringence
and dispersion measurement using spectroscopic of polarized light , ICOSN2001,
Yokohama (2001).
（37）Y.Otani, K.Ishizauka, T.Kannno, T.Yoshizawa : Plastic disk inspection
system : an approach from two dimensional birefringence distribution measurement,
Laser 2001, Munich (2001).
（38）T.Yoshizawa, H.Takahashi, M.Yamamoto, Y.Otani : Three-dimensional profilometry
using a hybrid grating projection, Laser 2001, Munich (2001).
（39）T.Yoshizawa, H.Takase, M.Yamamoto, Y.Otani : Optical fiber strain gauge
using a mirror with a pinhole, Proc.SPIE San Diego (2001).
（40）Y.Otani, Y.Matsuba, T.Yoshizawa :Photothermal actuator composed of
optical fibers, Proc.SPIE Boston (2001).
（41）Y.Otani, Y.Matsuba, T.Yoshizawa :Photothermal actuator composedof optical
fibers, Proc.SPIE Vol.4564, Boston (2001) 216-219.
（42）T.Yoshizawa, D.Hayashi, M.Yamamoto, Y.Otani : A walking machine driven
by a light beam, Proc.SPIE Vol.4564, Boston (2001) 229-237.
（43）H.Fujiwara, Y.Otani, T.Yoshizawa : Flatness measurement by UV moir・,
Proc.SPIE Vol.4564, Boston (2001) 323-330,.
（44）L.H.Jin, T.Hamada, Y.Otani : Measurement of characteristics of magnetic
fluid by Mueller matrix imaging Polarimeter , Proc.SPIE Vol.4919 , Shanghai
(2002) 183-189.
（45）T.Wakayama, H.Kowa, Y.Otani, N.Umeda : Two-dimensional measurement
of birefringence dispersion using spectroscopic polarized light, Proc.SPIE
Vol.4919 , Shanghai (2002)176-182.
（46）Y.Otani, L.H. Jin, Y.Sakaino : Two-dimensional birefringence measurement
using liquid crystal retarder for plastic disk inspection , Proc.SPIE Vol.4919
, Shanghai (2002) 190-194
（47）Y.Matsuba, Y.Otani, T.Yoshizawa : Optical Fiber Type Actuater using
Photothermal Effect - Experiment of Two Dimensional Movement , Proc.SPIE
Vol.4902 , Stuttgart (2002)
（48）T.Wakayama, H.Kowa, Y.Otani, N.Umeda, T.Yoshizawa : Birefringence dispersion
measurement by geometric phase, Proc.SPIE Vol.4902, Stuttgart (2002)
（49）R.Shimada, Y,Otani : Two-dimensional polarization measurement by optical
coherence tomography, Proc.SPIE Vol.4902 , Stuttgart(2002)
（50）Y.Otani, Y.Matsuba, A.Osaka : Micro bubble actuator using photo-thermal
effect : Proc.SPIE Vol.4902 , Stuttgart (2002)
（51）H.Fujiwara, Y.Otani, T.Yoshizawa : Reflection moire for high spatial
resolution, Proc.SPIE Vol.4902, , Stuttgart (2002) 275-284.
(52) Hiroo Fujita, Ken Yamatan, Masayuki Yamamoto, Yukitoshi Otani, Akira
Suguro, Shigeru Morokawa, Toru Yoshizawa : Three-dimensional profilometry
using liquid crystal grating , Proc. SPIE Vol. 5058 (2003)51-60.
(53) Y.Otani, M. Takahashi, L.Jin, H.Kowa, N.Umeda : Image detection system
for 157 nm using fluorescent glass, Advanced Characterization Techniques
for Optics, Semiconductors, and Nanotechnologies, Proc.SPIE Vol.5188, San
Diego (2003) 134-137.
(54) L.H.Jin, H.Kowa, Y.Otani, N.Umeda : Mueller matrix imaging polarimeter
in 157nm, Advanced Characterization Techniques for Optics, Semiconductors,
and Nanotechnologies, Proc.SPIE Vol.5188, San Diego (2003) 146-153.
(55) (Invited Paper) Toru Yoshizawa, Hiroo Fujita, Yukitoshi Otani, and
Masayuki Yamamoto : Three-dimensional imaging using liquid crystal grating
projection , Program on Algorithms, Architectures,
and Devices, Confence on Optical Information Systems , Proc. SPIE Vol.
5202 (2003) 30-37. (San Diego, USA, 2003年8月4日）．
(56) N. Umeda, S. Tanaka, A. Takayanagi, Y. Otani, and H. Kowa : Development
of birefringence measurement with double rotating polarization components,
Proceedings of SPIE.Vol.5192, (2003)1-6.
(57) T. Numata, A. Takayanagi, Y. Otani, and N. Umeda : Laser manipulation
and fixation of metal nanoparticles using optical fiber probe, Proceedings
of SPIE. VOL. 5220 (2003) 66-73.
(58) T.Wakayama, Y.Otani, N.Umeda : Two-dimensional measurement of birefringence
dispersion by geometric phase,University of Joensuu, Selected papers 8,
ICO Topical Meeting on Polarization optics
, Polvij較vi, Finland
(2003) 120-121.
(59) Y.Otani, T.Wakayama, YSakai, N.Umeda : Two-dimensional measurement
of birefringence distribution for DVD pickup lens, University of Joensuu,
Selected papers 8, ICO Topical Meeting on Polarization optics , Polvijvi,
Finland (2003) 232-233.
(60) Y.OTANI, Y.MATSUBA, S.CHIMURA, N.UMEDA, T.YOSHIZAWA : Micromanipulator
by photothermal effect, Proc.SPIE Vol. 5264, Optomechatronic Systems IV,
Providence, USA (2003) 150-153.
(61) Y.Kuwano, T.Tokunaga, T.Miyazaki, Kataoka, Y.Otani : Beam shaping
optics for YAG Laser by using CNC Lathe, Proc.SPIE Vol.5264, Optomechatronic
Systems IV, Providence, USA (2003) 237-240.
62) M.Ebisawa, Y.Otani, N.Umeda : Microscopic birefringence imaging by the
local-sampling phase shifting technique, Proc.SPIE Vol. 5462, pp.45-50,
Biophotonics micro nad nano imaging, Strasbourg, France (2004) .
(63) Y.Mizutani, K.Minato, Y.Otani, N.Umeda : Modeling error of sub wavelength structure for the rigorous coupled wave analysis, 204 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).
(64) R.Kuwano T.Tokunaga, Y.Otani, N.Umeda : Liquid pressure varifocus lens,
2004 ICO International Conference Optics & Photonics in technology Frontier,
Chiba (2004).
(65) Y.Takeda, H.Nagasaki, A.Takayanagi, Y.Otani, Y.Iimura, N.Umeda : Direct
orientation of liquid crystal molecules using an atomic force microscope
nano-rubbing,, 2004 ICO International Conference Optics & Photonics in
technology Frontier, Chiba (2004).
(66) T.Numata, Y.Morita, Y.Otani, N.Umeda : Laser fixation of metal
nanoparticles on glass substrate using CW-NIR Laser, 2004 ICO International
Conference Optics & Photonics in technology Frontier, Chiba (2004).
(67) T. Wakayama, Y. Otani, N. Umeda : Birefringence dispersion measurement
by geometric phase shifter, 2004 ICO International Conference Optics &
Photonics in technology Frontier, Chiba (2004).
(68) Toshitaka Wakayama, Yukitoshi Otani, Norihiro Umeda, Takashi Kurokawa :
Real time measurement of birefringence dispersion for LCD retardation film, 21
Century COE International symposium on LCDs and Related Materials (2004)
TUAT.
(69) (Invited Paper) Y.Otani, Y.Mizutani, N.Umeda, T.Yoshizawa :
Two-dimensional actuator using temperature-sensitive ferrite driven by light
beam, Proc. Vol. 5602, Optomechatronic Sensors, Actuators, and Control (2004)
Philadelphia.
(70) (Invited Paper) Y.Mizutani, Y.Otani, N.Umeda : Super oblique
incidence interferometer by using antireflection prism with sub-wavelength
structure, Proc SPIE Vol. 5633, Advanced Materials and Devices for Sensing and
Imaging II (2004) Beijing.
(71) Y.Mizutani, Y.Otani, N.Umeda, T.Yoshizawa : Super oblique
incidence interferometer by using antireflection prism with subwavelength
structure, Proc.SPIE Vol.5533, pp.10-16 (2005) Tokyo
(72) Y.Otani, Y.Mizutani, N.Umeda : Super oblique incidence interferometer
using SWS prism, Precision interferometric metrology, Proc. of American Society
of Precision Engineering (2005) Middletown
(73) T.Wakayama, Y.Otani, N.Umeda : Real-time measurement for
birefringence dispersion using double retarder, Proc.SPIE Vol.5888, pp.71-2
(2005) San Diego
(74) Alexander
V. Tavrov, Yukitoshi
Otani, Takashi Kurokawa, Mitsuo Takeda : 3D common-path interferometer:
achromatic nulling of on-axial light, Proc.SPIE Vol.5905 pp.1A-6
(2005)
(75) Y.Mizutani, R.Kuwano, Y.Otani, N.Umeda, T.Yoshizawa :
Three-dimensional shape measurement using focus method by using liquid crystal
grating and liquid varifocus lens, Proc.SPIE 6000,60000J-1-7, Two- and
Three-Dimensional Methods for Inspection and Metrology III , (2005) Boston
（76） Itaru Nishiyama, Norio Yoshida, Mizue Ebisawa, Atsuo Takayanagi,
Yukitoshi Otani, Norihiro Umeda : Direct alignment of nematic liquid crystal
molecule using atomic force microscope nano-rubbing, Proc.SPIE
Vol.6050,Optomechatronic Micro/Nano Devices and Components , 605013(2005).
(77) Ryoichi Kuwano, Tsuyoshi Tokunaga, Yukitoshi Otani, Norihiro
Umeda : Liquid pressure varifocus lens for YAG laser processing, Proc. SPIE
6048, Optomechatronic Actuators and Manipulation, Sapporo, 604805 (2005).
(78) Mizue Ebisawa, Yukitoshi Otani, Norihiro Umeda : Microscopic
measurement system for birefringence and optical rotation distribution, Proc.
SPIE 6048, Optomechatronic Actuators and Manipulation, Sapporo, 604807 (2005).
(79) Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro
Umeda : Displacement measurement by spectro-polarization modulator, Proc SPIE
Vol. 6292, Interferometry XIII: Techniques and Analysis, San Diego (2006)
629213.
(80) Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro
Umeda, Toru Yoshizawa : White light displacement sensor by spectro-polarization
modulator, Proc. SPIE Vol. 6382, Two- and Three-Dimensional Methods for
Inspection and Metrology IV, Boston, , 638205 (2006).
(81) Y. Mizutani, S. Nishimura, Y. Otani, N. Umeda : Optical driving
of actuator using poly-vinylidine difluoride cantilever, Proc.SPIE Vol.6374,
Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006)
637404.
(82) M. Ebisawa, Y. Otani, N. Umeda : Analysis of mechanical
characteristics by birefringence microscope, Proc.SPIE Vol.6374 ,
Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006)
637407.
(83) Y. Otani, Y. Hirai, Y. Mizutani, N. Umeda, T.Light-driven
micromanipulator and its application for 3D fabrications, Proc.SPIE Vol.6374 ,
Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006)
63740N.
(84) Y. Mizutani, Y. Otani, N. Umeda : Two-dimensional magnetic force
actuator using temperature sensitive ferrite driven by light beam, Proc.SPIE
Vol.6374 , Optomechatronic Actuators, Manipulation, and Systems Control .,
Boston, (2006) 637405 .
(85) Kuwano, R., Mizutani, Y., Tokunaga, T., Otani, Y. : Liquid
pressure varifocus lens using a fibrous actuator, Proceedings of SPIE - The
International Society for Optical Engineering, 6374, , Optomechatronic
Actuators, Manipulation, and Systems Control ., Boston, (2006) 63740I, .
(86) T. Wakayama, N. Asato, Y. Otani, N. Umeda : Polarization Mapping
System of Viewing Angle for Optical Films I nternational Display Workshop’06 ,
Workshop on FPD Manufacturing, Materials and Components (FMC) (2006) Otsu
pp.1015-1016.
(87) Y. Otani, T. Wakayama, N. Umeda, Takashi Kurokawa : One-Shot
Mapping System of Birefringence Dispersion for Retardation Films, International
Display Workshop’06 , Workshop on FPD Manufacturing, Materials and Components
(FMC) (2006) Ohtsu, pp.1013-1014.
(88) (Invited Paper) Y.Otani, T.Wakayama : Birefringence dispersion
measurement for advanced display materials, Optical Society of America Topical
meeting OPTICAL FABRICATION AND TESTING, Rochester USA (2006 Oct.10)OFTuC5.
(89) Y.Otani, Y. Mizutani : Light-driven actuators using optical
fiber and PVDF, The 1st Intersnational Symposium on Next-generatioion actuators
leading beakthroughs Proceedings, 165-167 (2006) Makuhari, JP.
(90) Yukitoshi Otani, Tomohito Kuwagaito, Yasuhiro Mizutani, Norihiro
Umeda : Nano-structure measurement by Mueller matrix polarimeter and RCWA 2007
SEM ANNUAL CONFERENCE & EXPOSITION ON EXPERIMENTAL & APPLIED
MECHANICS(2007.6) Springfield, USA, 1-4.
(91) B.Kato, T.Wakayama, Y.Otani, N.Umeda, “Simultaneous Measurement
Method of Birefringence and Optical Rotation Using Spectroscopic-Polarized
Modulator,” FiO/LS/OMD 2007 Conference proceedings (2007) OSA FThN7.
(92) Yukitoshi Otani, Yasuhiro Mizutani, and Norihiro Umeda :
Three-dimensional optical control of magnetic levitation by temperature
sensitive ferrite, Proc. SPIE 6715, 67150L (2007) Optomechatronic Actuators and
Manipulation III, Lausanne, Swizerland
(93) Y.Otani, T.Wakayama, N.Umeda,T.Yoshizawa, “Generation and
consideration of vectorial vortex array,”Proc.SPIE 6715, pp67150D (2007).
Optomechatronic Actuators and Manipulation III, Lausanne, Swizerland.
(94) (Invited Paper) Y.Otani, T.Wakayama : Birefringence dispersion
mapping by geometric phase, Photonics Asia, Advanced Materials and Devices for
Sensing and Imaging, Beijing , China (2007,11,13). (Presentation only).
(95) Tomohito Kuwagatio, Yasuhito Mizutani, Mitsuhito Ishihara,
Yukitoshi Otani, : Surface profile detection for nano-structures by Mueller,
PhotoAsia, Beijing , China (2007,11,3). (Presentation only).
(96) Fmio Kobayashi，Yukitoshi Otani，Toru Yoshizawa : 3D Surface
profile measurement by projection type moir? using LC grating,, Two- and
Three-Dimensional Methods for Inspection and Metrology VI, SPIE Optics and
Photonics 2008 (Presentation only).
(97) Yukitoshi OTANI, Takumi KIMURA, Yasuhiro MIZUTANI, Toshitaka
WAKAYAMA, Toru YOSHIZAWA : Three dimensional shape measurement using liquid
crystal grating scanner,, Two- and Three-Dimensional Methods for Inspection and
Metrology VI, SPIE Optics and Photonics 2008 (Presentation only).
(98) Yukitoshi Otani, Tomohito Kuwagaito, Yasuhiro Mizutani : Surface
profile detection with nanostructures using a Mueller matrix polarimeter ,
Proc.SPIE Vol: 7063, Interferometry XIV: Techniques and Analysis , 70630Y
(2008). Date: 11 August 2008
(99) Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa : Moir?
topography using a liquid-crystal-grating based frequency modulation technique ,
Proc.SPIE Vol.7063, Interferometry XIV: Techniques and Analysis , 70630O (2008).
Date: 11 August 2008.
(100) Yukitoshi Otani, Toshitaka Wakayama, Kazuhiko Oka, Norihiro
Umeda : Spectroscopic Mueller matrix polarimeter using four channeled spectra,
FiO/LS/OMD 2007 Conference proceedings (2008) OSA, FThQ8.
(101) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa :
Generation of vortex spectra based on geometric phase, FiO/LS/OMD 2007
Conference proceedings (2008) OSA, FThU5.
(102) Makoto Chujo, Yukitoshi Otani, Norihiro Umeda : Spectroscopic
Mueller Matrix Polarimeter by Two Liquid Crystal Polarization Modulator ,
FiO/LS/OMD 2007 Conference proceedings (2008) OSA , JSuA16.
(103) Yukitoshi Otani , Toshitaka Wakayama : Two-dimensional
Measurement of Birefringence Dispersion, 2008 SEM Fall Conference Celebrating
the 60th Birthday of Holography (2008) 1-5.
(104) Y. Otani, Tokyo Univ. of Agriculture and Technology (Japan); Y.
Bellouard, Technische Univ. Eindhoven (Netherlands) : Light-driven
micro-actuators and Light-based micromanipulation tool, [7266A 101],
Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008).
(105) T. Wakayama, Y. Otani, T. Yoshizawa: : Generation of vortex
spectra based on geometric phase for optical tweezers, ) [7266A 107]
Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008) 72660A.
72660A-1-A6 (106) Y. Mizutani, Y. Otani : Optically controlled
bimorph cantilever by Poly(vinylidenedifluoride) and its application of optical
actuator, [7266A 110] Optomechatronic Actuators and Manipulation IV, ISOT 2008
(2008) 72660D. 72660D1-D7 .
(107) Fumio Kobayashi ,Yukitoshi Otani ,Toru Yoshizawa : 3D Surface
profile measurement by projection type moir? using LC grating, 2008 Japan Taiwan
Bilateral Science; Technology Symposium, (2008/11/11) Utunomiya
University pp.145~147.
(108) Yasuhiro Mizutani, Tomohito Kuwagaito, Yukitoshi Otani :
Surface profile detection of nanostructures by Mueller matrix, 2008 Japan Taiwan
Bilateral Science; Technology Symposium, (2008/11/11) Utunomiya
University pp.136~138.
(109) (Inivited paper) Yukitoshi OTANI, Yasuhiro MIZUTANI : Optically
driven actuator and manipulator, First International Conference on Trends in
Optics and Photonics (2009).
(110) Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa :
Three-dimensional surface profile measurement by projection type moir? using LC
grating, irst International Conference on Trends in Optics and Photonics
(2009).
(111) (Iinivited paper) Yukitoshi Otani : Polarization Technology for
3D Surface Detection - An Approach for Nano Structure Measurement and Machine
Vision, First International Conference on Trends in Optics and Photonics,
Tutorial , Kolkata, India ( March 1, 2009).
(112) Yukitoshi Otani, Naoya YOSHIZAWA, Yasuhiro MIZUTANI : Paul
trapping for microscopic particle and its application for crystal growth ,
ICMDT2009 The 3rd International Conference on Manufacturing , Machine Design and
Tribology, Jeju Island, Korea, June 25-26, 2009.
(113) Yukitoshi Otani, Makoto Chujo : Spectroscopic Mueller matrix
polarimeter by double liquid crystal phase modulators, Proc.SPIE 7461 (2009).
(114) Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki Amamiya, Makoto
Chujo , Yukitoshi Otani : Spectroscopic Stokes polarimeter with dual rotating
retarder and analyzer for optical rotation measurement, Proc.SPIE 7461(2009).
(115) Toshitaka WAKAYAMA, Yukitoshi OTANI and Toru YOSHIZAWA :
Axisymmetrical Mueller matrix polarimeter, Proc.SPIE 7461(2009).
(116) Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Toru
Yoshizawa : Three-dimensional profilometry based on focus method by projecting
LC grating pattern, Proc.SPIE 7432 (2009) pp.743210.
(117) (Invited paper) Yukitoshi Otani : Mueller matrix polarimeter
for nano-structure measurement, CLEO/PR 2009 (2009).
(118) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa:
Spectroscopic birefringence imaging microscope based on channeled spectrum
technique 3rd International Conference of Asiaon Society for Precision
Enginerring and Nanotechnology (2009) pp.2D-8-2975 1-4.
(119) Yasuhiro Mizutani, Yoshiyuki Uehane, Yukitoshi Otani, Norihiro
Umeda: Scatterometry using rigorous coupled-wave analysis and Mueller matrix
decomposition, 3rd International Conference of Asiaon Society for Precision
Enginerring and Nanotechnology (2009) pp.2D-13-2136 1-4.
(120) Ryoichi Kuwano, Yasuhiro Mizutani, Tsuyoshi Tokunaga, Yukitoshi
Otani : Liquid pressure varifocus lens for three-dimensional measurement, 3rd
International Conference of Asiaon Society for Precision Enginerring and
Nanotechnology (2009) 2P10-1-4.
(121) Yukitoshi Otani , Satoshi Takano, Yasuhiro Mizutani :
Nano-structure measurement by Mueller matrix, Spectro-polarimeter, 5th
International Conference on Spectroscopic Ellipsometry, ICSE (2010). May 23-28
Albany NY USA.
(122) Yasuhiro Mizutani, Tsutsumi Akihiro and Otani Yukitoshi : Optically
Driven Method for Magnetically Levitating a Diamagnetic Material Using
the Photothermal Effect, ISOT 2010 International Symposium on Optomechatronic
Technologies, p.A-5, Toronto, (2010)
(123) Yukitoshi Otani, Yamabe Yasuaki and Yasuhiro Mizutani : Manipulation
of Droplet and Crystal Growth by Paul Effect, ISOT 2010 International Symposium
on Optomechatronic Technologies, p.SP-MNM-5, Toronto, Canada, (2010).
(124) Toshitaka Wakayama, Yukitoshi Otani, and Toru Yoshizawa：Spectroscopic
topological Stokes polarimeter, Proc. of SPIE 7855, 785504 (2010)
(125) Yukitoshi Otani, Toshitaka Wakayama, Masanosuke Tanaka, Makoto Chujo
: Real-time monitoring of optical rotation with wavelength dependence by
spectroscopic polarized modulation, Conference 7906A Optical Diagnostics
and Sensing XI: Toward Point-of-Care Diagnostics Photonics West 2011 (2011)
(126) Fumio Kobayashi, Yasuhiro Mizutani, Yukitoshi Otani and Toru Yoshizawa
: Uni-axial profilometry by liquid crystal digital shifter, International
Conference on Optics in Precision Engineering and Nanotechnology (ICOPEN2011),
Singapore, (2011).
(127) Ginya Makoto, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani
: Polarization properties of PLZT under applied voltage measured by dual-rotating
retarder polarimeter, International Conference on Optics in Precision Engineering
and Nanotechnology (ICOPEN2011), Singapore, (2011).
(128) Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki Amemiya, Yukitoshi
Otani : Dual rotating polarimeter for optical activity, International Conference
on Optics in Precision Engineering and Nanotechnology (ICOPEN2011), Singapore,
(2011)
(129) (inivited paper) Yukitoshi OTANI, Fumio KOBAYASHI, Yasuhiro MIZUTANI,
Manabu Harada , Toru YOSHIZAWA, : Uni-axial 3-D shape measurement by liquid
crystal digital shifter, SPECIAL SYMPOSIUM ON MODERN EXPERIMENTAL METHODS
IN MECHANICS, ENGINEERING, AND THE SCIENCES, ICCS2011 International Conference
on Computational & Experimental Engineering and Sciences , Nanjing
China (2011).
(130) (inivited paper) Yukitoshi OTANI : " Center for Optical Research
and Education based on Classical Optical Technology "Forum on Optics
and Laser in Engg. Singapore (2011).
(131) (inivited paper) Yukitoshi OTANI, Shogo Ishida : "Full and partial
Mueller matrix polarimeter by dual photo-elastic modulator, 22nd General
Congress of the International Commission for Optics (ICO), Purbra, Mexico
(2011).
(132) Masanosuke Tanaka, Yoshinori Nakashima, Hideyuki Amemiya, Toshitaka
Wakayama2 Yukitoshi Otani : High-speed and -accuracy measurement of optical
rotation by liquid crystal modulators, SPIE Optics and Photonics 2011,
Optical Manufacturing and Testing IX, San Diego ( 2011).
(133) Toshitaka Wakayama, Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki
Amemiya, Yukitoshi Otani : Spectorsocpic Stokes polarimeter based on dual
liquid crystal modulators, SPIE Optics and Photonics 2011, Polarization
Science and Remote Sensing V, , San Diego (2011).
(134) Yukitoshi OTANI, Masanosuke TANAKA, Toshitaka WAKAYAMA : Spectorsocpic
Stokes polarimeter using dual liquid crystal modulators, OIE'11 - The Ninth
Japan-Finland Joint Symposium on Optics in Engineering, Turku Finland (2011).
(135) Toshitaka Wakayama, Y. Otani, T. Yoshizawa : Spectroscopic birefringence
mapping by channeled spectrum , 2011 BSSM/SEM International Conference
on Advances in Experimental Mechanics: Integrating Simulation and Experimentation
for Validation (ISEV) , Edinburgh UK (2011).
(136) Fumio Kobayashi, Yukitoshi OTANI, Toru Yoshizawa : Projection Moiré
Profilometry using Liquid Crystal Digital Gratings, 10th IMEKO Symposium
LMPMI (Laser Metrology for Precision Measurement and Inspection in Industry),
Brawnschweig, Germany (2011).
(137) (inivited paper) S.Ishida, Y.Otani : Mueller matrix polarimeter using
dual photoelastic modulator, ISOT2011, Hong Kong, China (2011).
(138) R.Mizutani , Y.Otani : Stokes polarimeter with optical fiber probe,
ISOT2011, Hong Kong, China (2011).
(139) (inivited paper) ）H.Onuma, Y.Otani : H.Onuma, Y.Otani : Real-time
Measurement Method for Birefringence Distribution by Dynamic Stokes PolarimeteISOT2011,
Hong Kong, China (2011).
(140) (inivited paper) Y.Otani , Yasuhiro Mizutani: Evaluation of photoalignment
films by UV polarimeter, ISOT2011, Hong Kong, China (2011).
(141) (inivited paper) ）Y.Otani, Shgo Ishida : Mueller Matrix Polarimeter
with Full and Partial Elements by Double Photo-Elastic Modulators, 2011
Taiwan-Japan Bilateral Symposium in Nano/Bio-Photonics2011, TJBS2011, Tainan,
Taiwan (2011).
(142)（Plenary talk）Y.Otani : Dynamic Birefringence Mapping, IConTop 2011,
Kolkata, India (2011).
(143) Takashi Ouma, Yukitoshi Otani : Dynamic birefringence mapping, Photonics
Europe, Brussels, Belgium (2012).
(144) (inivited paper) Yukitoshi Otani, Takashi Onuma : Real-time birefringence
mapping by dynamic Stokes polarimeter, The 2nd Special Symposium in Experimental
Mechanics, Engineering , and Science in Grete, Greece (2012).
(145) (inivited paper) Yukitoshi Otani : Nano-structure inspection by dual-rotating
Mueller matrix spectro-polarimeter, SEM Congress & Exposition on Experimental
& Applied Mechanics, Costa Mesa, CA, USA (2012).
(146) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa : Achromatic
Axially-Symmetric Wave Plate, The 8th International Conference on Optics-Photonics
Design and Fabrication , ODF12, Saint Petersburg, Russia (2012).
(147) Yukitoshi Otani, Takashi Onuma : Real-time birefringence mapping
by polarization high-speed image sensor, 4th International Workshop on
Perspectives of Optical Imaging and Metrology - Holomet2012 , Utsunomiya(2012).
(148) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa : An interferometric
observation of topological effect by novel axially symmetrical wave plate,
SPIE Optics and Photonics Conference 8493, Interferometry XVI: Techniques
and Analysis, San Diego USA (2012).
(149) Yui Satake, Yukitoshi Otani and Isamu Maeda : Photosynthetic fuel
cell using purple non-sulfur bacteria, International Symposium on Optomechatronic
Technologies - ISOT 2012 , Paris France (2012)
(150) Yuichi Kanamori and Yukitoshi Otani : Driving droplet by photo-thermal
Marangoni convection, I International Symposium on Optomechatronic Technologies
- ISOT2012, Paris France (2012).
(151) Shuhei Shibata, Takashi Onuma and Yukitoshi Otani : Realtime birefringence
mapping by polarization camera, International Symposium on Optomechatronic
Technologies -ISOT2012, Paris France (2012).
(152) Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani
: Low-voltage driven method of ferroelectric memory device using optical
polarization property International Symposium on Optomechatronic Technologies
-ISOT2012, Paris France (2012).
(153) Yuki Nagata, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani
Photothermal imaging for single nanoparticle using near-common path interferometer
International Symposium on Optomechatronic Technologies -ISOT2012, Paris
France (2012).
(154) Ryota Mizutani, Yukitoshi Otani, Tomoharu Ishikawa, Miyoshi Ayama
: Imaging Stokes polarimeter by dual rotating retarder and analyzer and
its application of evaluation of Japanese lacquer, Photonics Asia - Optical
Metrology and Inspection for Industrial Applications II Paper 8563-13,
Beijing China (2012).
(155) (inivited paper) Yukitoshi Otani, Takashi Onuma : Dynamic birefringence
mapping by high-speed polarization image sensor, 2012 IUTAM symposium on
advances of optical methods in experimental mechanics- Taiwan (2012).
(156) Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Toru Yoshizawa
: Uniaxial 3D shape measurement by LC digital shifter, Optics in Precision
Engineering and Nanotechnology (icOPEN2013). Singapore (2013).
(157) Yuichi Kanamori, Yukitoshi Otani : Driving droplet by photo-thermal
Marangoni convection, ICMDT 2013 Proceedings of The 5th International Conference
on Manufacturing, Machine Design and Tribology, Pusan, Korea (2013).
(158) Shuhei Shibata, Takashi Onuma, Yukitoshi Otani : Real-time birefringence
mapping by full-Stokes polarization camera, 6th International Conference
on Spectroscopic Ellipsometry (ICSE VI),
Kyoto (2013).
(159) Ryota Mizutani, Toshitaka Wakayama, Yukitoshi Otani : Dual rotating
type of generalized Stokes polarimeter, 6th International Conference on
Spectroscopic Ellipsometry (ICSE VI), Kyoto (2013).
(160) Yukitoshi Otani, Shuhei Shibata, Fumio Kobayashi, Yasuhiro Mizutani,
Toru Yoshizawa : Real-time uniaxial profilometry using contrast detection
by polarization camera, SPIE Optics and Photonics 2013, Dimensional Optical
Metrology and Inspection for Practical Applications II, San Diego ( 2013).
(161) Yuichi Kanamori, Yukitoshi Otani : Optical driving of thedroplet
by photo-thermal Marangoni convection, Utsunomiya (2013).
(162) David I. Serrano-Garcia, A. Martinez Garcia, N.I. Toto-Arellano,
Yukitoshi Otani : Single shot phase shifting interferometry using a two
interferograms phase shifting algorithm, Utsunomiya (2013).
(163) (Inivited paper) Yukitoshi Otani, Shuhei Shibata, Taakashi Onuma:
Real-time Stokes mapping by polarization camera and its application to
high-speed birefringence imaging, 2013 International Symposium on Optomechatronic
Technologies (ISOT2013), Jeju, Korea (2013).
(164 )David I. Serrano-Garcia, Yukitoshi Otani, Amalia Martinez-Garcia,
Noel-Ivan Toto-Arellano : Single shot phase shifting interferometry using
a two-interferograms phase shifting algorithm, 2013 International Symposium
on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).
(165) Yo Kamata, Jun-ichiro Sugisaka, Yukitoshi Otani, Toyohiko Yatagai
: Nano-structure Evaluation using Transmission Type Spectroscopic Mueller
Matrix Polarimeter and Boundary Element Method, 2013 International Symposium
on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).
(166) Masahito Sakaguchi, Yukitoshi Otani : Development of a Spectroscopic
Mueller matrix Microscope for Biological Samples Analysis 2013 International
Symposium on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).
(167) Takashi. Onuma, Yukitoshi. Otani : A High-speed Measurement System
for Birefringence Distribution, 21st DYMAT Technical Meeting, High speed
imaging for dynamic testing of materials and structures, London, UK (2013).
(168) (Inivited paper) Yukitoshi Otani, Shuhei Shibata, Takashi Onuma:
Real-Time Imaging Polarimeter by Full-Stokes Polarization Camera, 2013
Japan-Taiwan Bilateral Symposium in Nano/Bio-Photonics (2013 JTBS), Hamamatsu
(2013).
(169) Shuhei Shibata, Fumio Kobayashi and Yukitoshi Otani : Uniaxial three-dimensional
surface measurement by polarization camera with real-time, 2013 Japan-Taiwan
Bilateral Symposium in Nano/Bio-Photonics (2013 JTBS), Hamamatsu (2013).
(170) Yuichi Kanamori, Yukitoshi Otani : Optical driving of the droplet
by photo-thermal Marangoni convection, 2013 Japan-Taiwan Bilateral Symposium
in Nano/Bio-Photonics (2013 JTBS), Hamamatsu (2013).
(171) Toshitaka Wakayama, Kazuyuki Sakaue, Takeshi Higashiguchi, Yukitoshi
Otani, Masakazu Washio, Motoki Yonemura, Toru Yoshizawa : THz Vector Beam
generated by Achromatic Axially Symmetric Wave Plate, The 9th International
Conference on Optics-photonics Design and Fabrication, “ODF'14, Itabashi,
Tokyo” (2014).
(172) Shuhei Shibata, Takashi Onuma, Yukitoshi Otani : Spectroscopic birefringence
mapping by full-Stokes polarization camera, The 9th International Conference
on Optics-photonics Design and Fabrication, “ODF'14, Itabashi, Tokyo” (2014).
(173) (Inivited paper) Yukitoshi Otani, Toshitaka Wakayama :Achromatic
axially symmetric wave plate and its application to radial polarization
beam, International Conference on Optics & Optoelectronics, ICOL2014
(2014).
(174) Masahito Sakaguchi, Yutaka Kodama, Yukitoshi Otani : Spectroscopic
Mueller Matrix Microscope Using Dual-rotating Retarders, The 1st Biomedical
Imaging and Sensing Conference (BISC’14) (2014).
(175) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada, Yukitoshi Otani
: Dynamic and uniaxial profilometry by polarization camera, Photonics Europe
(2014).
(176) Takashi ONUMA, Yukitoshi OTANI : High-speed birefringence mapping
by polarization camera and its application for film orientation tracking,
SPIE Sensing Technology + Applications, Baltimore, USA (2014).
(177) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada and Yukitoshi Otani
: Real-time and uniaxial measurement of 3D profile by polarization camera,
SPIE Sensing Technology + Applications, Baltimore, USA (2014).
(178) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada, Yukitoshi Otani
: Microscopic type of real-time uniaxial 3D profilometry by polarization
camera, SPIE Optics and Photonics, San Diego, USA (2014).
(179) David I. Serrano-Garcia, Amalia Martinez-Garcia, Noel-Ivan Toto-Arellano
and Yukitoshi Otani : Dynamic temperature field measurements using a polarization
phase shifting technique, SPIE Optics and Photonics, San Diego, USA (2014).
(180) Yukitoshi Otani, Shuhei Shibata : Real-time imaging Stokes polarimeter
by polarization camera and its application to birefringence mapping, ICO
2014, Santiago de Compostela, Spain (2014).
(181) David I. Serrano-García and Yukitoshi Otani : 3-D SURFACE PROFILOMETRY
EMPLOYING THE POLARIZATION PHASE SHIFTING TECHNIQUE, The International
Symposium on Laser Metrology for Precision Measurement and Inspection in
Industry 2014 : IMEKO, Tsukuba, Japan (2014).
(182) Yukitoshi Otani, Shuhei Shibata, Takashi Onuma : REAL-TIME MEASUREMENT
OF STOKES PARAMETERS BY POLARIZATION CAMERA, 16th International Conference
on Experimental Mechanics (ICEM-16), Cambridge UK (2014).
(183) (Inivited paper) Yukitoshi Otani, Shuhei Shibata : Dynamic measurement
of Stokes parameters and birefringence mapping by full-Stokes polarization
camera, Photonics Asia 2014 "Optical Metrology and Inspection for
Industrial Applications III", Beijing , China (2014).
(184) (Inivited paper) Yukitoshi Otani, Hiroshi Hasegawa : Imaging polarimeter
for spectroscopic full-Stokes parameters and its application to flaw detection,
The 2014 International Coference on Photonics and Optical Engineering (icPOE)
, Xi'an , China (2014).
(185) Hiroshi Hasegawa and Yukitoshi Otani : Imaging Stokes polarimeter
on six-axis robot arm, International Symposium on Optomechatronic Technologies
(ISOT2014), Seattle (2014).
(186) Yiheng Lim and Yukitoshi Otani : Simultaneous spectroscopic and elastographic
measurement by multifunctional optical coherence tomography: Imaging Stokes
polarimeter on six-axis robot arm, International Symposium on Optomechatronic
Technologies (ISOT2014), Seattle (2014).
(187) (Inivited paper) Yukitoshi Otani and Shuhei Shibata : Spectroscopic
full-field Stokes polarimeter, International Symposium on Optomechatronic
Technologies (ISOT2014), Seattle (2014).
3．Libros
（1）大谷幸利 （共著）：”３.１ 光切断法の原理と応用”，光三次元計測（１）（新技術コミュニケーションズ，1993）28-37．
（2）大谷幸利，吉澤徹（共著）：”3．光ヘテロダイン干渉法”，O plus E シリーズ(２)
光ヘテロダイン技術（新技術コミュニケーションズ，1994 ）55-68．
（3）電子画像学会 3次元画像調査委員会 3次元画像用語事典編集委員会編：３次元画像用語事典（新技術コミュニケーションズ，2000）．
（4）大谷幸利（共著）：最新光三次元計測，7.2半導体産業（朝倉書店，2006）92-97．（5）
Yukitoshi Otani, Farrokh Janabi-Sharifi : Proceedings of SPIE 6374
Optomechatronic Actuators, Manipulation, and Systems Control (SPIE, 2006).
（6）大谷幸利（共著）：光学用透明樹脂における材料設計と応用技術，第6章第1節屈折率の評価（技術情報協会，2007）301-314．
（7）大谷幸利 （共著）：”第5章 縞解析法”，三次元工学２ 光三次元・産業への応用（アドコムメディア，2007）146-166．
（8）Yves Bellouard, Yukitoshi Otani, Kee S. Moon, Editors ,
Proceedings of SPIEVolume 6715 -- Optomechatronic Actuators and Manipulation III
(October 2007, SPIE).
（9） Yukitoshi Otani,Yves Bellouard Editors , Proceedings of
SPIEVolume 7266 Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008).
(10) Yukitoshi Otani : Handbook of Optical Metorology, Principles and
Applications, Ed.T.Yoshizawa (CRC Press, 2009) Chapter26 Birefringence
Measurement, 615-630.
(11)大谷幸利（共著）： 光学材料の屈折率制御の最前線，第2編第３章 液晶ディスプレイ2次元複屈折計測（シーエムシー出版，2009）64-74．
(12)大谷幸利： 第2編第5章5節 「光駆動による次世代ナノ・マイクロアクチュエータの開発」，樋口俊郎，大岡 昌博 編 アクチュエータ研究開発の最前線（エヌ・ティー・エス，2011年8月）486-491．
(13 )George K. Knopf, Yukitoshi Otani 編著: Optical Nano and Micro Actuator
Technology (CRC Press, 2012) 639 Pages.
(14) Yasuhiro Mizutani, Yukitoshi Otani：8. Ellipsometry at the Nanostructure,
Ellipsometry at the Nanoscale (Losurdo, Maria; Hingerl, Kurt (Eds.), Springer,
2013) 313-324.
(15) Yukitoshi Otani : Chapter 11 Uniaxial 3D Shape Measurement, Handbook
of 3D Machine Vision, 275-284 (Song Zhang (Ed.) , CRC press, 2013,3).
(16) 大谷幸利：「45. 偏光素子」pp.186-188,「59．偏光計測」pp239-242, 黒田和男，荒木敬介，大木裕史，武田光夫，森伸芳，谷田貝豊彦
編；光学技術の事典（朝倉書店，2014）
4．Artículos de Revisión Bibliográfica
（1）大谷幸利，吉澤徹：光ヘテロダイン干渉計測技術，Ｏ plus Ｅ，150
（1992）85.
（2）吉澤徹，大谷幸利：変革期に見る産業用イメージセンサ，映像情報，2（1996）29-32.・lt;/P>
（3）吉澤徹，梅田倫弘，大谷幸利：研究室紹介 東京農工大学機械システム工学科，レーザ協会誌，21，3（1996）68-74．
（4）大谷幸利：文献抄録”フラットテストのための格子干渉計”，光学，26,7（1997）388．
（5）大谷幸利：文献抄録”音響光学ドーブプリズムを用いた機械的な機構をもたない画像回転”，光学，26,12（1997）702．
（6）大谷幸利，吉澤徹：位相シフト法による二次元複屈折測定，光学, 27,12（1998）698-703．
（7）大谷幸利：文献抄録”構造化された光線を用いた光学顕微鏡におけるオプティカル・セクショニング法”，光学，28,2（1999）106．
（8）大谷幸利：”1998年光学界の進展 9. 干渉計測”，光学，28,4（1999）171-181．
（9）吉澤徹，大谷幸利：２次元複屈折分布測定技術，光アライアンス，9（1999）1-4．
（10）大谷幸利：光駆動走行マシン，光アライアンス，10（1999）40－42．
（11）大谷幸利：文献抄録”マイクロストラクチャー線幅計測のための位相シフト偏光干渉計”，光学，28,11（1999）636.
（12）大谷幸利，吉澤徹：位相シフト干渉法による高精度表面形状計測，Ｏ plus Ｅ，22,5 （2000）601-607.
（13）大谷幸利，吉澤徹：低コヒーレンス干渉計を用いた偏光情報測定，光学 ，29，10（2000）602-607.
（14）大谷幸利 他：リサーチアンドアナリシス「表面形状検査技術」光産業振興協会オプトニューズ,122, 2（2001）18-20．
（15）大谷幸利：国際会議リポート「Photonics 2000」光産業振興協会オプトニューズ,122, 2（2001）47-48．
（16）新井泰彦，大谷幸利，吉澤徹：フォトニクス技術における新原理と要素技術に関する調査分科会の紹介，精密工学会誌，68,8（2002）1013-1015．
（17）大谷幸利：複屈折分布によるディスク検査，レーザ協会誌，27，3,4（2002）62-69．
（18）大谷幸利：総論：偏光・複屈折計測における最近の話題，Ｏ plus Ｅ，25,11 （2003）1220-1225.
（19）大谷幸利：液晶デバイスと製造評価，精密工学会誌，70, 5（2004）598-601.
（20）若山俊隆，大谷幸利：幾何学的位相とその光計測への応用，光アライアンス，15, 7（2004）33－37．
（21）大谷幸利：高岳レビュー，巻頭言（2005）.
(22）大谷幸利：研究室紹介大谷研究室，精密工学会誌，71, 6（2005）.
（23）大谷幸利：特集のポイント：偏光技術の新たな展開：偏光計測から光駆動まで，Ｏ plus Ｅ，29,1 （2007）20-22.
（24）若山俊隆，吉澤徹，大谷幸利：分光偏光変調による光計測の高機能化，Ｏ plus Ｅ，29,1 （2007）36-40.
（25）藤田宏夫，水谷康弘，大谷幸利，吉澤徹：液晶格子による光切断を用いた三次元形状計測，光アライアンス，19,7 (2008)
p.41-44..
（26）大谷幸利：光学素子の偏光・複屈折問題とその評価法，レーザ協会誌，33，2（2008）pp.14-21.
（27）大谷幸利：創立100年を目指して，高岳レビュー, 172, (2008)
（28）大谷幸利：特集のポイント：身近な安全を支える光技術，Ｏ plus Ｅ，31, 7 （2009）742-743.
（29）大谷幸利：液晶フィルムの偏光計測法，液晶（日本液晶学会誌），13, 4 （2009）273-281.
（30）大谷幸利：財団法人 光産業技術振興協会，国際会議速報 国際会議速報H21-No.20 - 第6分野 加工・計測，SPIE
Optics+Photonics 2009 ショート速報 [加工・計測関連], (2009)インターネット版
(31) 大谷幸利，若山俊隆：分光偏光変調を用いたミュラー行列測定，光学,39,8 (2010) 385-391.
(32) 大谷幸利：偏光解析と干渉計測 ，オプトロニクス, 29,8 (2010) 111-116.
(33) 大谷幸利：ミュラー行列偏光計 ，光技術コンタクト, 48, 3 (2010) 104 -108.
(34) 大谷幸利：特集のポイント光で／を動かす技術, Ｏ plus Ｅ, 32, 5 (2010) 517-518.
（35）大谷幸利：コラム・日本縦断研究室巡り 宇都宮大学 オプティクス教育研究センター，レーザ協会誌，37，2（2012）pp.39-42.
(36) 大谷幸利：光駆動ナノ・マイクロマシン, 応用物理学会誌, 82, 1 (2013) 33-36.
(37) 大谷幸利：偏光技術とその応用, Ｏ plus Ｅ, 35, 1 (2013) 33 -34.
（38）大谷幸利：光と画像2013年：回顧，展望と大予測：偏光技術とその応用，Ｏ plus Ｅ，35,1 （2013）33-34.
（39）大谷幸利：分光ミュラー行列偏光計，表面科学，35 , 9 （2014）510-515.
（40）大谷幸利：光学素子計測についての技術動向と展望，精密工学会誌，80, 6（2014）501-505.
（41）大谷幸利：３次元計測技術，日本画像学会誌，53 , 2 （2014）128-135.
（42）大谷幸利：最近の三次元計測技術の最新動向，画像ラボ, 11（2014）42-48.
5．Patentes
（1）光アイソレータ，平成３年４月．
（2）光アイソレータ，平成３年４月．
（3）"Optical isolator device having a wider cutoff wavelength band for
a return light beam" UnitedStates Patent No.5375009
(1994) .
（4）非接触三次元形状計測装置，特願平 5 - 123884 ．
（5）表面形状測定装置，特願平 6-123843．
（6）表面状態測定方法，特願平 8-07313993．
（7）斜入射干渉計，（平成6年074219 ）．
（8）３次元形状測定システム（平成6年049145 ）
（9）ディスク基板の内部応力状態の測定法（特願２０００－３５８２０）
（10）表面形状測定装置（特願平2000－229907）
（11）波長依存性を考慮した複屈折測定装置及び方法，（特願平2001-373232）
（12）表面形状測定装置 出願番号：特願平2000－229907 出願日：平成12年7月28日
（13）特願平2001-373232 波長依存性を考慮した複屈折測定装置及び方法
（14）特願２００４－０５０９９１：複屈折分散計測装置および複屈折分散計測方法
（15）複屈折特性装置および複屈折特性測定方法、特願２００４－０７０２１６．
（16）特開2001-141602 複屈折評価装置および複屈折評価方法
（17）特開2001-141522 光学式エンコーダ
（18）特開2000-065549 非球面鏡の形状測定方法および形状測定装置
（19）特開平11-257930 三次元形状測定装置
（20）特開平11-083454 格子パターン投影法を用いた３次元形状測定装置
（21）特開平09-152318 表面状態測定方法
（22）特開平07-332956 表面形状測定装置
（23）特開平07-260451 ３次元形状測定システム
（24）特開平07-260420 斜入射干渉計
（25）特開平06-331329 非接触三次元形状計測装置
（26) 偏光状態測定装置，円二色性測定装置及びその方法，特願2005-280367.
（27）特性計測装置及び計測方法，特願2005-172848.
（28）複屈折特性測定装置および複屈折特性測定方法，特願2004-070216.
（29）複屈折特性計測装置及び計測方法，特願2005-92525.
（30）複屈折分散計測装置および複屈折分散計測方法，特願2004-050991.
（31）三次元磁気浮上装置、および永久磁石の三次元浮上方法， 特願2007-045687 公開番号2008-211901
（32）光学特性計測装置及び光学特性計測方法，特願2006-054182，公開番号2007-232550
（33）計測装置及び計測方法，特願PCT/JP2007/052844，公開番号WO2007/099791
（34）計測装置及び計測方法，特願12/224491公開番号：WO2007/099791
（35）計測装置及び計測方法，特願20087022194，公開番号WO2007/099791
（36）計測装置及び計測方法，特願2008-502703，公開番号WO2007/099791
（37）光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット，特願PCT/JP2007/055355，公開番号WO2007/111159
（38）光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット，特願12/225384，公開番号WO2007/111159
（39）光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット，特願2008-507432，公開番号WO2007/111159
（40）光特性計測装置及び光特性計測方法，特願2005-337614，公開番号2007-139772
（41）計測装置及び計測方法、並びに、特性計測ユニット,特願PCT/JP2006/326056，公開番号WO2007/080790
（42）計測装置及び計測方法、並びに、特性計測ユニット，特願番12/087663，公開番号WO2007/080790
（43）計測装置及び計測方法、並びに、特性計測ユニット，特願2007-553876，公開番号WO2007/080790
（44）光学特性計測装置及び光学特性計測方法，出願番号PCT/JP2006/311615，公開番号WO2006/134840
（45）光学特性計測装置及び光学特性計測方法，出願番号11/922006，公開番号WO2006/134840
（46）光学特性計測装置及び光学特性計測方法，出願番号特願2006-54153，公開番号200714891
（47）光学特性計測装置及び光学特性計測方法，出願番号2007-521264，公開番号WO2006/134840
（48）三次元形状計測装置および三次元形状計測方法，出願番号2005-347575，公開番号2007-155379
（49）光学特性計測装置及び光学特性計測方法，出願番号11/887410，公開番号WO2006/103953
（50）光学特性計測装置及び光学特性計測方法，出願番号007-510390，公開番号WO2006/103953
（51）光学特性計測装置および方法，出願番号2006-116844，公開番号2007-286011
（52）偏光状態測定装置、円二色性測定装置及びその方法，出願番号2005-280367，公開番号2007-093289
６．Presentaciones Invitadas
(1) 大谷
幸利：キーノートスピーチ：光による形状計測，精密工学会秋季学術講演会 北海道大学 (1998)．
(2) Y.Otani : "Moire topography with sensitivity of sub-micrometer"
Seminar, Center for Optics Manufacturing (COM) Univ.of Rochester, 24th July
(1998).
(3) 大谷 幸利：内部情報をとらえる－複屈折からのアプローチ－，光交流会 第129回オプトフォーラム
，ココリサーチホール11月17日(1999)．
(4) 大谷 幸利：二次元複屈折分布の計測技術，三次元工学研究会 ，パシフィコ横浜会議センター 12月1日(1999)．
(5) 大谷 幸利：ディスクの表面および内部状態の光学的測定法，プラスチック成型加工学会 第51回講演会 4月21日(2000)．
(6）大谷
幸利：イントロダクトリートーク「最近の格子パターン投影法を用いた形状計測」，平成１２年度日本光学会北陸信越講演会，新潟大学11月1日（2000）
(7) Y.Otani : Lecture "Three dimensional shape measurement using
grating projection method", Calcutta University, 21th December (2000).
(８)大谷幸利：「先端メカトロニクス技術のための光技術」TAMA産学連携フェスタin 狭山，2月7日（2001）.
(９)
大谷幸利：「偏光測定のための干渉計測技術」2001-1光センシング技術部会，（社）日本オプトメカトロニクス協会，6月14日，機械振興会館（2001）．
(10) 大谷幸利：複屈折測定によるディスクの検査，レーザ計測技術の最近の動向，レーザ協会，1月25日，中央大学駿河台記念館（2002）．
(11) 大谷幸利：２次元複屈折分散計測法，計測自動制御学会北海道支部講演会，3月22日，北海道大学（2002）．
(12) 大谷幸利：偏光の基礎と回折光学への展望，オプティカルソリューションズセミナー，5月17日，港区勤労福祉会館（2002）．
(13）大谷幸利
：長野県精密工業試験場 平成14年度技術交流プラザ「製品検査のためのセンシング技術の研究」分科会（第８回）「光応用計測の現状と応用～表面形状から内部情報まで～」，長野県精密工業試験場（2003年2月26日）．
(14) 大谷幸利：大学発ニューテクノロジー研究・開発・ベンチャー」No.2 液晶ディスプレイのための２次元複屈折分散計測,
IGAS2003 印刷機材団体協議会，東京ビックサイト（2003年9月23日）．
(15）大谷 幸利：偏光分光干渉による２次元複屈折分散計測法，平成１５年度日本光学会北陸信越講演会，新潟大学11月７日（2003）．
(16)大谷 幸利：偏光分光干渉による２次元複屈折分散計測法，第７回光波シンセシス研究会11月20日（2003）．
(17）大谷幸利：（キーノート）メカノフォトニクスにおける光駆動技術，精密工学会秋季学術講演会 (2004)
(18）Y.Otani : Moir? and Fringe Projection Systems, Science &
Technology school on Diffractive Optics and Optical Metology（University of
Calcutta） 2006/ 12/ 28 Calcutta University, Kolkata, India
(19）大谷幸利 ： 分光偏光変調による分光偏光・複屈折イメージング応物，２００７年春季第５４回応用物理学関係連合講演会シンポジウム「分光センシング技術の新たな活用と展開」（2007）．（3月28日 青山学院大学）
(20）大谷幸利：実用化のための偏光・複屈折評価法 ～液晶用光機能性高分子フィルムへの応用～，精密工学会秋季大会シンポジウム「最先端の光計測」（9月12日 旭川勤労福祉会館）（2007）．
(21）大谷 幸利：縞解析法のナノ計測への応用，光応用技術シンポジウム Senspec2008 （2008/6/12 パシフィコ横浜）.
(22）Y.Otani : The Department of Mechanical Engineering/College of
Engineering and Applied Sciences, Stony Brook University, Mechanical Engineering
Seminar : Research at the Optomechatoronics Lab., Tokyo University of
Agriculture and Technology, Japan.Friday, October 24, 2008, 2:30 PM, Room 231
Engineering Building.
(23)大谷 幸利 ：分光ミュラー行列イメージング，応用光学懇談会第137回講演会 （2009/1/9） 大阪・島津マルチホール．
(24) 大谷 幸利
：フォトサーマル効果を用いた光駆動アクチュエータ，レーザ学会学術講演会第29回年次大会（2009/1/11）徳島大学．
(25) 大谷
幸利:：分光ミュラー行列偏光計とその応用，第５６回応用物理学関係連合講演会シンポジウム「偏光計測の基礎と応用最前線」（2009）（3月30日 筑波大学）．
７．Notas Periodísticas
(1)朝日新聞の2014年6月17日「子供光教室ー光学の世界への招待」
(2)読売新聞の2014年6月20日「子供向け光教室」
(3)東京新聞の2015年1月14日「光学で国際交流を」
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