大谷・ヘーガン研究室       
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1) 原著論文

2) 国際会議

3) 著書

4) 解説記事

5) 特許 

6) 招待講演 

7) 新聞掲載
1.原著論文 

(95) Toshitaka Wakayama, Takeshi Higashiguchi, Kazuyuki Sakaue, Masakazu Washio, Yukitoshi Otani: Demonstration of a terahertz pure vector beam by tailoring geometric phase, Scientific reports, 8:8690 (2018) DOI:10.1038/s41598-018-26964-76, pp 1–11. (IF 5.578).

(94) Nathan Hagen, Yukitoshi Otani : Stokes polarimeter performance: general noise model and analysis, Applied Optics,57(15), 4283-4296 (2018) (IF1.650).

(93) Toshitaka Wakayama, Takeshi Higashiguchi, Yukitoshi Otani : Generation of the determined vectorial vortex beams by use of an achromatic axially symmetric wave plate, Optical Review, 24, 3 (2017 June) pp 449–461 (IF 0.496). doi:10.1007/s10043-017-0315-1.

(92) Kaustav Bhattacharyya, David Ignacio Serrano-García , Yukitoshi Otani : Accuracy enhancement of dual rotating Mueller matrix imaging polarimeter by diattenuation and retardance error calibration approach, Optics communications, 392 (2017) 48–53 (IF 1.480).

(91) Geliztle A. Parra Escamilla, Fumio Kobayashi, Yukitoshi Otani : Three-Dimensional Surface Measurement based on the Projected Defocused Pattern Technique Using Imaging Fiber Optics, Optics Communications, 390 (2017) 57–60 (IF 1.480).

(90) David I.Serrano-Garcia, Yukitoshi Otani : Dynamic phase measurements based on a polarization Michelson interferometer employing a pixelated polarization camera, Advanced Optical Technologies. 20160054, ISSN (Online) 2192-8584, ISSN (Print) 2192-8576, DOI: https://doi.org/10.1515/aot-2016-0054, December 2016(IF 0.60).

(89) Joel Cervantes-L David I.Serrano-Garcia,Yukitoshi Otani,and Barry Cense : Mueller-matrix modeling and characterization of a dual-crystal electro-optic modulator,Optics Express *, * (2016) (IF 3.148) in press.

(88) Yiheng Lim, Toyohiko Yatagai, Yukitoshi Otani: Ultra-high resolution spectral domain optical coherence tomography using supercontinuum light source, Optical Review, 23, 2, (2016)pp.180-186 (IF 0.496).

(87) Wei Xie, Aiko Kawahito, Takuya Miura, Takashi Endo, Yongming Wang, Takashi Yanase, Taro Nagahama, Yukitoshi Otani, and Toshihiro Shimada : Colorful Carbon Nanopopcorns Formed by Codepositing C60 with Diamond-like Carbon Followed by Reaction with Water Vapor Chemistry letters, 44,9 (2015)pp.1205-1207 (IF 1.230).

(86) Toshitaka Wakayama, Hiroki Oikawa, Atsushi Sasanuma, Goki Arai, Yusuke Fujii,Thanh-Hung Dinh, Takeshi Higashiguchi, Kazuyuki Sakaue, Masakazu Washio, Taisuke Miura, Akihiko Takahashi, Daisuke Nakamura, Tatsuo Okada, Motoki Yonemura and Yukitoshi Otani : Generation of radially polarized high energy mid-infrared optical vortex by use of a passive axially symmetric ZnSe waveplate, Applied Physics Letters 107(8):081112. DOI:10.1063/1.4929686 (2015) · (IF 3.30) .

(85) Toshitaka Wakayama, Takeshi Higashiguchi, Hiroki Oikawa, Kazuyuki Sakaue, Masakazu Washio, Motoki Yonemura, Toru Yoshizawa, J. Scott Tyo, and Yukitoshi Otani : Determination of the polarization states of an arbitrary polarized terahertz beam: Vectorial vortex analysis, Scientific Reports 5, 9416 (2015) doi:10.1038/srep09416 (IF 5.578).

(84) Fanny Moses Gladys, Masaru Matsuda, Yiheng Lim, Boaz Jessie Jackin, Takuto Imai, Yukitoshi Otani, Toyohiko Yatagai and Barry Cense : Developmental and morphological studies in Japanese medaka with ultra-high resolution optical coherence tomography, Biomedical Optics Express, 6, 2, pp.297-308 (2015)

(83) David-Ignacio Serrano-García, Amalia Martinez-García,Noel-Iván Toto-Arellano, Yukitoshi Otani : Single shot interferometry using a two-interferogram phase shifting algorithm, Advanced Optical Technologies,3, 4 (2014) pp.401–406,

(82) Hayato Ohashi, Takeshi Higashiguchi, Yuhei Suzuki, Goki Arai,Yukitoshi Otani, Toyohiko Yatagai, Bowen Li, Padraig Dunne, Gerry O’Sullivan, Weihua Jiang, Akira Endo, Hiroyuki A. Sakaue, Daiji Kato, Izumi Murakami, Naoki Tamura, Shigeru Sudo, Fumihiro Koike, and Chihiro Suzuki : Quasi-Moseley’s law for strong narrow bandwidth soft x-ray sources containing higher charge-state ions, APPLIED PHYSICS LETTERS 104, 234107 (2014) pp.234107-1 -234107-5.

(81)David Ignacio Serrano-García, Amalia Martínez-García, Noel-Ivan Toto-Arellano, Yukitoshi Otani: Dynamic temperature field measurements using a polarization phase-shifting technique, Optical Engineering, 53, 11 (2014) 112202-112202.

(80) Toshitaka Wakayama,Oscar G. Rodríguez-Herrera, J. Scott Tyo, Yukitoshi Otani, Motoki Yonemura, and Toru Yoshizawa : Generation of achromatic, uniform-phase, radially polarized beams,Optics Express 22, 1 (2014) pp.3306-3315.

(79) Takashi Onuma, Yukitoshi Otani : A development of two-dimensional birefringence distribution measurement system with a sampling rate of 1.3 MHz, Optics Communications, 315,15(2014) 69–73.

(78) Yuki Nagata, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani :Photothermal Imaging for Single Nanoparticle Using Single Element, Interferometer International Journal of Optomechatronics,7,2 (2013) 96–104.

(77)Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani:All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix, Sensors and Actuators A: Physical, 200 (2013) 37-43.

(76)Toshitaka Wakayama, Kazuki Komaki, Yukitoshi Otani, Toru Yoshizawa : Achromatic axially symmetric wave plate, Optics Express, 20, 28 (2012) pp.29260–29265.

(75)大沼隼志,大谷幸利:サブミリ秒の時間分解能をもつ動的 2 次元複屈折計測装置の開発,精密工学会誌.78.12 (2012) 1082-1086.

(74)Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa : Projection type of moiré topography with frequency modulation technique using liquid crystal digital gratings, Optical Review, (2012) pp.154-158

(73)田中政之介,中島吉則,雨宮秀行,大谷幸利:液晶位相変調器を用いたストークス偏光計,光学,41,3 (2012) pp.149-157.

(72)Ryoichi KUWANO, Toshihiko KOGA, Tsuyoshi TOKUNAGA, Toshitaka WAKAYAMA, Yukitoshi OTANI, Nobuyuki FUJII : Ring Beam Shaping Optics Fabricated with Ultra-precision Cutting for YAG Laser Processing, Optical Review, (2012).

(71) Yasuhiro Mizutani, Akihiro Tsutsumi, Tetsuo Iwata, Yukitoshi Otani : Optically driven method for magnetically levitating diamagnetic material using photothermal effect, JOURNAL OF APPLIED PHYSICS 111, pp.023909-1 - 023909-5 (2012).

(70)Takayuki Higuchi, Yasuhiro Mizutani, Tetsuo Iwata,  Yukitoshi Otani : Stroboscopic oblique-incidence interferometer for motion visualization of stator of ultrasonic motor, Physics Procedia 19 (2011) 82–87.

(69)Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata, Yukitoshi Otani : Polarization properties of PLZT under applied voltage measured by dual-rotating retarder polarimeter, Physics Procedia 19 (2011) 398–402.

(68)田中政之介,中條 充,中島吉則,雨宮秀行,大谷幸利:2重回転分光ストークスポラリメータの開発と液晶セルの特性評価,光学,40,8 (2011) .

(67)田中政之介,中島吉則,雨宮秀行,若山俊隆,大谷幸利:液晶偏光変調器を用いた旋光計測装置の開発,光学,40,7 (2011) pp.350-356.

(66)小林富美男,大谷幸利,吉澤徹:デジタル液晶変調器による格子投影型モアレ三次元次元計測,精密工学会誌.76.10 (2010) 1031-1035.

(65)N. Ghosh, Y. Otani, K. Bhattacharya : Generation of collinearly propagating orthogonally polarized beam, Optik - Int. J. Light Electron Opt. (2010), doi:10.1016

(64)Yasuhiro Mizutani, Yukitoshi Otani, and Norihiro Umeda: “Optically-driven Micromanipulator for Three-dimensional Fabrications,” International Journal of Optomechatronics, 3, 1: (2009) 18?29..

(63)加藤波里,若山俊隆,大谷幸利:分光偏光変調を用いた複屈折および旋光同時計測法,光学,37,11 (2008) pp.657-664.

(62)Yukitoshi Otani, Toshitaka Wakayama, Kazuhiko Oka, Norihiro Umeda : Spectroscopic Mueller matrix polarimeter using four-channeled spectra, Optics Communications, 281 (2008) 5725?5730.

(61)Yasuhiro Mizutani, Yukitoshi Otani, Norihiro Umeda : Optically driven actuators using Poly(vinylidene difluoride), Optical Review, 15, 3 (2008) 162 - 165.

(60)Toshitaka Wakayama,Yukitoshi Otani, Norihiro Umeda : One-shot birefringence dispersion measurement based on channeled spectrum technique, Optics Communications, 281, 14 (2008) 3668?3672.

(59)Yasuhiro Mizutani, Mizue Ebisawa, Yukitoshi Otani, Norihiro Umeda: “Optically 3D Controlled Magnetic Levitation Using Temperature Sensitive Ferrite,” Jpn. J. Appl. Phys., 47, pp. 3461-3465 (2008).

(58)Yasuhiro Mizutani, Yukitoshi Otani, Norihiro Umeda : Optically controlled bimorph cantilever of Poly(vinylidene difluoride), Applied Physics Express, 1 (2008) 041601-1 - 041601-3.

(57)Numata, T., Otani.Y., Umeda, N. : Meso-porous membrane of noble metal for surface plasmon resonance gas sensors, Journal of Materials Science, 42 (3), (2007) pp. 1050-1053.

(56)Nishiyama, I., Yoshida, N., Otani.Y., Umeda, N. : Direct alignment of liquid crystal molecules using an atomic force microscope, Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 46 (2), (2007) pp. 729-731

(55)沼田孝之,岩崎吉朗,大谷幸利,梅田倫弘:表面プラズモン共鳴を用いた光タクタイル圧力センサ,電気学会論文誌E(センサ・マイクロマシン),92, 127 (3) (2007) pp.192-193.

(54)Nishiyama, I., Yoshida, N.,Otani.Y., Umeda, N. : Single-shot birefringence measurement using radial polarizer fabricated by direct atomic force microscope stroking method, Measurement Science and Technology, 18 (6) (2007) pp.1673-1677.

(53)西山 達,保坂佳正,大谷幸利,梅田倫弘:液晶位相格子を用いた光制御 ― 光熱スイッチの開発,電気学会論文誌(電子・情報・システム部門誌),127-C,6 (2007) 966- 967.

(52)Mizue Ebisawa, Yukitoshi Otani Norihiro Umeda : Mechanical characterization measurement of polymer material under stress by birefringence microscope, Optical Review, 14,5 (2007) 310-313.

(51)Takayuki Numata, Hirokazu Tatsuta, Yoshiaki Morita, Yukitoshi Otani and Norihiro Umeda : Localized thermal processing with a laser-trapped and heated metal nanoparticle, Transactions on Electrical and Electronic Engineering, 2 (2007)398-401.

(50)海老澤瑞枝,酒井洋平,大谷幸利,梅田倫弘:微小レンズの2次元複屈折分布計測,精密工学会誌,73, 3(2007)389-392.

(49)Takayuki Numata, Yukitoshi Otani and Norihiro Umeda : Optical Dew Sensor Using Surface Plasmon Resonance of Periodic Ag Nanostructure, Japanese Journal of Applied Physics,45, 30, pp.L810-813 (2006).

(48)Numata, T., Otani.Y., Umeda, N. : Optical dew sensor using surface plasmon resonance of periodic Ag nanostructure, Japanese Journal of Applied Physics, Part 2: Letters, 45 (29-32), (2006) pp. L810-L813.

(47)Qin, J., Nagai, H., Numata, T., Otani.Y, ., Umeda, N. : Observation of 3-D birefringence distribution of polymer thin film by near-field optical microscope , Journal of Physics: Conference Series, 48 (1), 175 (2006), pp. 926-931.

(46)海老澤瑞枝,佐久間淳,大谷幸利:生体軟組織の引張変形過程における細胞内ひずみ分布の複屈折顕微鏡による観察,日本機械学会誌,72, 724(2006)2079-2085.

(45)水谷康弘,桑野亮一,大谷幸利,梅田倫弘,吉澤 徹:可変焦点レンズを用いたフォーカス法による三次元形状計測,精密工学会誌,72, 9 (2006) 1152-1156.

(44)T.Wakayama, Y.Otani, N.Umeda : Birefringence dispersion measurement based on achromatic four points of geometric phase, Optical Engineering,, 45, 8 (2006) 083603.

(43)若山俊隆,大谷幸利,梅田倫弘,黒川隆志:ライン型分光器による分光複屈折計測,精密工学会誌,72,5 (2006) 602-606.

(42)水谷康弘,大谷幸利,梅田倫弘:感温磁性体による光熱変換方式2次元アクチュエータ,電気学会論文誌E,126, 4 (2006)170-171.

(41)T.Wakayama, H.Kowa, Y. Otani, , N.Umeda : Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light, Optical Engineering, 45, 033601 (2006).

(40) Takayuki Numata, Atsuo Takayanagi, Yukitoshi Otani, , Norihiro Umeda : Manipulation of metal nanoparticles using fiber-optic laser tweezers with a microspherical focusing lens, Jpn. J. Appl.Phy., 45, 1A (2006) 359-363.

(39)若山俊隆,大谷幸利,梅田倫弘:分光偏光変調による旋光分散計測,光学,35,1(2006)31-36.

(38)Ryoichi Kuwano, Tsuyoshi Tokunaga, Yukitoshi Otani, , Norihiro Umeda : Beam Shaping Optics for YAG Laser by Using CNC Lathe, Optical Review,12, 6 (2005) 476-479.

(37)R.Kuwano T.Tokunaga, Y. Otani, , N.Umeda : Liquid pressure varifocus lens, Optical Review, 12, 5 (2005) 405-408.

(36)Alexander V. Tavrov, Yosuke Kobayashi, Yosuke Tanaka, Tatsutoshi Shioda, Yukitoshi Otani, Takashi Kurokawa, M.Takeda : Common-path achromatic interferometer-coronagraph: nulling of polychromatic light, Optics Letters, 30, 17 (2005) 2224-2226

(35)Lianhua Jin, Kuniharu Takizawa, Yukitoshi Otani, and Norihiro Umeda : Multi-wavelength Mueller matrix polarimeter, Optical Review, 12, 4 (2005) 281-286.

(34)海老澤瑞枝,大谷幸利,梅田倫弘:顕微鏡型複屈折マッピングシステム,精密工学会誌,70, 6(2004).

(33)Lianhua Jin, Takayuki Hamada, Yukitoshi Otani, Norihiro Umeda : Measurement of characteristics of magnetic fluid by the Mueller matrix imaging polarimeter, Optical Engineering,,42, 1 (2004) 181-185

(32)Shinya Okubo, Shohei Yamazaki, Atsuo Takayanagi, Yukitoshi Otani, Norihiro Umeda :Shear-force detection by reusable quartz tuning fork without external vibration, Optical Review, 10, 2 (2003) 128-130.

(31)Shinya Okubo, Yukitoshi Otani, Norihiro Umeda :Electromagnetic field analysis for circulary polarized light at apex of the near field probe, Jpn.J.Appl.Phy., 42 (2003)L297-L300.

(30)若山俊隆, 高和宏行, 大谷幸利, 梅田倫弘, 吉澤徹:波長依存性を考慮した2次元複屈折計測,光学,31,11(2002)826-831

(29)L.H.Jin, T.Yoshizawa, Y.Otani : Fringe scanning moire by means frequency modulation technique, Optical Engineering, 40, 7(2001)1383-1386.

(28)山谷謙,山本将之,藤田宏夫,勝呂彰,大谷幸利,諸川滋,吉澤徹:液晶格子パターンによる3次元形状計測,精密工学会誌,67, 5(2001)786-790.

(27)M.I.Shribak, Y.Otani, T.Yoshizawa : Autocollimation polarimeter for measuring two-dimensional distribution of birefringence, Journal Optics & Spectroscopy", 89,1 (2000) 155-159.

(26)L.H.Jin, Y.Kodera, T.Yoshizawa, Y.Otani : Shadow moire profilometry using phase-shifting method, Optical Engineering ,39,8 (2000) 2119-2123.

(25)小田 功,大谷幸利,リレンリュウ,吉澤徹:Cu:KNSBN結晶のフォトリフラクティブ二光波混合によるパターンマッチング, 光学,29,1(2000)33-38.

(24)殿岡雅仁, 山本将之,大谷幸利,吉澤徹,石原満宏,中里康生,佐々木博美:格子パターン投影法を用いた位相およびコントラスト検出による表面形状計測,精密工学会誌,66, 1(2000)132-136

(23)小寺豊,金蓮花,大谷幸利,吉澤徹:位相シフト実体格子型モアレ法による形状計測,精密工学会誌,65, 10(1999)1456-1460.

(22)山本将之,殿岡雅仁,大谷幸利,吉澤 徹,天野覺:格子パターン投影法を用いた反射物体の表面形状計測(第2法)- 楕円面鏡の計測,精密工学会誌,65,8(1999)1111-1115.

(21)福島健一,大谷幸利,吉澤 徹:圧電素子と感温フェライトからなる光駆動走行マシン,精密工学会誌,64,10 (1998) 1512-1516.

(20)桑原豊明,大谷幸利,吉澤 徹:ワンステップ位相シフト法を用いたアブラムソン干渉計による表面形状計測,精密工学会誌,64,9 (1998) 1380-1384.

(19)山本将之,殿岡雅仁,大谷幸利,吉澤 徹:格子パターン投影法を用いた反射物体の表面形状計測,精密工学会誌,64,8 (1998) 1171-1175.

(18)I.Oda, Y.Otani, L.Liu, T.Yoshizawa : Vibration detection using moving grating technique in photorefractive two-wave mixing, Japanese Journal of Applied Physics,37,part 1, 6A (1998) 3304-3308.

(17)森 洋篤,大谷幸利,吉澤徹:局所サンプリング位相シフト法を用いた表面形状計測,精密工学会誌,64,6(1998)856-860.

(16)I.Oda, Y.Otani, L.Liu and T.Yoshizawa : Polarization effect for vibration detection using photorefractive two-wave mixing in KNSBN:Cu crystal, Optics Communications, 148(1998)95-100.

(15)Y.Otani, N.Okuhara, T.Yoshizawa : Measurement of nonoptical surfaces for determination of Poison's ratio by oblique incidence interferometry , Optical Engineering, 37, 1 (1998) 261-265.

(14)小田 功,大谷幸利,リレンリュウ,吉澤徹:”フォトリフラクティブ二光波混合による干渉計の周波数応答”,光学,26,11(1997)593-598.

(13)Y.Otani, A.Tanahashi, T.Yoshizawa : " Light source with orthogonally linear polarized two-frequency beam from laser diode and surface profile measurement", Optical Engineering,35,4(1996)1070-1073.

(12)東根亜紀,大谷幸利,高和宏行,徳永剛,吉澤徹:”パターン投影法における縞次数の決定法とレンズ素材の形状計測ヘの応用”,精密工学会誌,61,12(1995)1701-1705.

(11)Y.Otani, T.Yoshizawa : "Two-dimensional magnetic field distribution measurement using the birefringence effects of magnetic fluids", Optik , 100, 3 (1995) 133-136.

(10)大谷幸利,小田悦宏,井門 修,藤田宏夫,吉澤徹:”音響光学素子を用いた差動型光ヘテロダイン干渉法による3次元表面形状計測”,精密工学会誌,61,8(1995)1091-1094.

(9)棚橋昌史,大谷幸利,吉澤徹:”半導体レーザを用いた直交2周波光源の開発”,光学,23,12(1994)758-764.

(8)Y.Otani, T.Shimada, T.Yoshizawa : "The local-sampling phase shifting technique for precise two-dimensional birefringence measurement", Optical Reviw , 1, 1(1994)103-106.

(7)R.Gu, T.Yoshizawa, Y.Otani : " One-step phase shift 3-D surface profilometry with grating projection", Optics and Lasers in Engineering,21,1-2 (1994 )61-75.

(6)Y.Otani, T.Shimada, T.Yoshizawa, N.Umeda : "Two-dimensional Birefringence Measurement using the Phase Shifting Technique", Optical Engineering,33, 5( 1994 )1604-1609.

(5)Y.Otani, T.Yoshizawa, A.Tanahashi : " Magnetostatic field measurement by optical heterodyne method with magnetic fluids", Optical Engineering, 33, 4( 1994 )1069-1073.

(4)大谷幸利,吉澤徹,押野則子:位相シフト型アブラムソン干渉計による粗面測定,精密工学会誌,60,3( 1994)432-435.

(3)大谷幸利,棚橋昌史,吉澤徹:磁性流体を用いた磁場センシング,精密工学会誌,59,7(1993)1109-1113.

(2)大谷幸利,島田卓也,吉澤徹,梅田倫弘:位相シフト法による2次元複屈折分布測定,光学 21,10 (1992)682-687.

(1)吉澤徹,大谷幸利:サブミクロン感度をもつモアレトポグラフィ法,精密工学会誌 55,1(1989)152-154.



2.国際会議

(1)Y.Otani, T.Shimada, T.Yoshizawa, N.Umeda : "Two-dimensional birefringence measurement using the phase shifting technique", Proc. SPIE 1720(1992) 346-354.

(2)Y.Otani, T.Yoshizawa, A.Tanahashi : "Optical heterodyne measurement of magnetic field using magnetic fluid", Proc. SPIE 1756 (1992)75-80.

(3)T.Yoshizawa, Y.Otani, A.Tochigi, T.Furuki : "Displacement measurement by the detection of contrast variation of a projected pattern",Proc.SPIE 1756 (1992) 82-85.

(4)Y.Otani, T.Shimada, T.Yoshizawa : "The local-sampling phase shifting technique for precise two-dimensional birefringence measurement"

, Frontiers in Information Optics, Topical Meeting of The International Commission for Optics Meeting Digesat ( 1994 ) 178.

(5)N.Okuhara, R.Gu, Y.Otani, T.Yoshizawa : "Interference measurement of nonoptical surface by one-step phase shifting technique", Frontiers in Information Optics, Topical Meeting of The International Commission for Optics Meeting Digesat ( 1994 ) 181.

(6)T.Yoshizawa, R.Komatsubara, Y.Otani, Y.Kawaguchi : "Non-contact 3D Measurement System for Assessment of Wrinkles", Optical Methods in Bio-Medical and Environmental Sciences Third InternationalConference of the International Society on Optics Within Life Sciences Absrtuct (1994 ) 61.

(7)Y.Otani, T.Yoshizawa : "Polariscope using the Phase Shifting Technique", Proc. SPIE Vol.2265,    "Polarization Analysis and Measurement II" ( 1994 ) 54-61.

(8)Y.Otani, T.Yoshizawa : "Two-dimentional magnetic dield measuremnt using the magnetooptic effects of magnetic fluids", Proc. SPIE Vol.2321 ICOESE'94 ( 1994 ) 9-15.

(9)T.Yoshizawa, R.Komatsubara, Y.Otani, Y.Kawaguchi : "Non-contact 3D Measurement System for Assessment of Wrinkles", Third International Conference on Optics Within Life Sciences OWLS III (ELSERVIER, 1994 ) 129-132.

(10)Y.Otani, A.Tanahashi, T.Yoshizawa : " Light source with orthogonally linear polarized two-frequency beam from laser diode and its applicatin", Proc.SPIE Vol. 2576 (1995) 293-298.

(11)Y.Otani, T.Yoshizawa : "Measurement of two-dimensional birefringence distribution for laser materials", Proc.SPIE "Polarization Analysis and Applications to Device to Technology " Vol.2873 (1996) 160-163.

(12)I.Oda, Y.Otani, D.Just,L.Liu,T.Yoshizawa : "Vibration detection using photorefractive two-wave mixing in KNSBN:Cu crystal and its polarization effect", Proc. SPIE Vol.2873 (1996) 164-167.

(13)Y.Otani, N.Okuhara, T.Yoshizawa : " Nonoptical surface measurement by oblique incidence interferometry" , Proc.SPIE Vol.2860 "Interferometry VIII: Techniques and Analysis" Denver (1996) 302-305.

(14)Y.Otani, H.Mori, T.Yoshizawa : "Precise surface measurement by local sampling phase shifting technique", Proc.SPIE Vol.2860 "Interferometry VIII: Techniques and Analysis" Denver (1996) 122-125.

(15)H. Fujiwara, Y.Otani, T.Yoshizawa : " Flatness measrement by reflection moire technique ", Proc.SPIE Vol.2862 "Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays" Denver (1996) 172-176.

(16)I.Oda, Y.Otani, D.Just, L.Liu and T.Yoshizawa : "Frequency Response in Vibration Detection by Photorefractive Two-wave Mixing", 1996 International Workshop on Interferometry, August (1996), Saitama 51-52.

(17)M.Yamamoto, Y.Otani, T.Yoshizawa : "Surface profile analysis using oblique incidence interferometry", 1996 International Workshop on Interferometry, August (1996), Saitama 131-132.

(18)Y.Otani, T.Nakano, T.Yoshizawa : "Optical heterodyne light source using laser diodes and its application to hybrid measurement", Proc.SPIE Vol.3098 "Optical Inspection and Micromeasurements"
Munich (1997) 294-298.

(19)Y.Otani , T.Kuwahara, T.Yoshizawa : Precise measurement of nonoptical surface by oblique incidence interferometer, Proc.SPIE Vol.3478(1998) 214-217.

(20)H. Fujiwara, Y.Kodera, Y.Otani, T.Yoshizawa : Flatness measurement by UV moire technique, Proc.SPIE Vol.3478 (1998) 444-447.

(21)K.Fukushima, Y.Otani, T.Yoshizawa : Optical driving of a miniature machine consisting of piezoelectric elements and temperature-sensitive ferrite, Proc.of China-Japan Bilateral Symposium on Advanced Manufacturing Engineering (Press of Univ. of Science and Technology of China,
1998) 49-54.

(22)H.Mori, Y.Otani, T.Yoshizawa : Local sampling phase-shifting technique for precise surface profile measurement, Proc.of China-Japan Bilateral Symposium on Advanced Manufacturing Engineering (Press of Univ. of Science and Technology of China, 1998)136-139.

(23)M.Ishihara, Y.Nakazato, H.Ssasaki, M.Tonooka, M.Yamamoto, Y.Otani, T.Yoshizawa : Three-dimensional surface measurement using grating projection method by detecting phase and contrast, Proc. ICOSN'99,
Yokohama (1999)114-117.

(24)L.H.Jin, Y.Kodera, T.Yoshizawa, Y.Otani : Shadow moire profilometry using phase-shifting method, Proc. ICOSN'99, Yokohama (1999)110-113.

(25)K.Yamatani, M.Yamamoto, Y.Otani, T.Yoshizawa, H.Fujita, A.Suguro, S.Morokawa : Three dimensional surface profilometry using structured liquid crystal grating, Proc.SPIE Vol.3782, Denver (1999) 291-296.

(26)M.I.Shribak, Y.Otani, T.Yoshizawa : Return-path polarimeter for two dimensional birefringence distribution measurement, Proc.SPIE,3754, Denver (1999) 144-149.

(27)Y.Otani, H.Mori, T.Yoshizawa : Precise surface measurement by local sampling phase shifting interferometry, 9th ICPE, Osaka(1999)342-347.

(28)H.Fujiwara, Y.Kodera, Y.Otani, T.Yoshizawa : Flatness measruement bi moir・technique for large diameter wafer, 9th ICPE, Osaka (1999)348-353.


(29)M.I.Shribak, Y.Otani, T.Yoshizawa : Phase-shifting method for two dimensional birefringence distribution measurement with return-path beams, Proc.SPIE Vol.4148, Liviv, Ukraine (1999) 55-61.

(30)Y.Otani, N.Dushkina, T.Kannno, T.Yoshizawa : Disk inspection system by two dimensional birefringence distribution measurement , Proc.SPIE Vol.4081, Phonics Taiwan (2000) 17-20.

(31)T.Yoshizawa, T.Yamaguchi, M.Yamamoto, Y.Otani : Three dimensional profilometry using moire pattern projection, Proc.SPIE, SanDiego (2000).

(32)H.Kowa, K.Muraki, Y.Otani, N.Umeda, T.Yoshizawa : High-order birefringence measurement using spectroscopic polarized light, Proc.SPIE Vol.4133,San Diego (2000).

(33)T.Yoshizawa, D.Hayashi, Y.Otani : Optical driving of a miniature walking machine composed of temperature-sensitive ferrite and shape memory alloy, Proc.SPIE Vol.4190 , Boston (2000).


(34)T.Yoshizawa, T.Shinoda, Y.Otani : Uni-axis range finder using contrast detection of a projected pattern, Proc.SPIE Vol.4190 , Boston (2000).

(35)Y.Otani, K.Ishizauka, T.Kannno, T.Yoshizawa : Microscopic measurement system for two dimensional birefringence distribution, Photonics 2000, Calcutta, India (2000).

(36)T.Wakayama, H.Kowa, Y.Otani, N.Umeda, T.Yoshizawa: High-order birefringence and dispersion measurement using spectroscopic of polarized light , ICOSN2001, Yokohama (2001).

(37)Y.Otani, K.Ishizauka, T.Kannno, T.Yoshizawa : Plastic disk inspection system : an approach from two dimensional birefringence distribution measurement, Laser 2001, Munich (2001).

(38)T.Yoshizawa, H.Takahashi, M.Yamamoto, Y.Otani : Three-dimensional profilometry using a hybrid grating projection, Laser 2001, Munich (2001).

(39)T.Yoshizawa, H.Takase, M.Yamamoto, Y.Otani : Optical fiber strain gauge using a mirror with a pinhole, Proc.SPIE San Diego (2001).

(40)Y.Otani, Y.Matsuba, T.Yoshizawa :Photothermal actuator composed of optical fibers, Proc.SPIE Boston (2001).

(41)Y.Otani, Y.Matsuba, T.Yoshizawa :Photothermal actuator composedof optical fibers, Proc.SPIE Vol.4564, Boston (2001) 216-219.

(42)T.Yoshizawa, D.Hayashi, M.Yamamoto, Y.Otani : A walking machine driven by a light beam, Proc.SPIE Vol.4564, Boston (2001) 229-237.

(43)H.Fujiwara, Y.Otani, T.Yoshizawa : Flatness measurement by UV moir・, Proc.SPIE Vol.4564, Boston (2001) 323-330,.

(44)L.H.Jin, T.Hamada, Y.Otani : Measurement of characteristics of magnetic fluid by Mueller matrix imaging Polarimeter , Proc.SPIE Vol.4919 , Shanghai (2002) 183-189.


(45)T.Wakayama, H.Kowa, Y.Otani, N.Umeda : Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light, Proc.SPIE Vol.4919 , Shanghai (2002)176-182.

(46)Y.Otani, L.H. Jin, Y.Sakaino : Two-dimensional birefringence measurement using liquid crystal retarder for plastic disk inspection , Proc.SPIE Vol.4919 , Shanghai (2002) 190-194

(47)Y.Matsuba, Y.Otani, T.Yoshizawa : Optical Fiber Type Actuater using Photothermal Effect - Experiment of Two Dimensional Movement , Proc.SPIE Vol.4902 , Stuttgart (2002)

(48)T.Wakayama, H.Kowa, Y.Otani, N.Umeda, T.Yoshizawa : Birefringence dispersion measurement by geometric phase, Proc.SPIE Vol.4902, Stuttgart (2002)

(49)R.Shimada, Y,Otani : Two-dimensional polarization measurement by optical coherence tomography, Proc.SPIE Vol.4902 , Stuttgart(2002)

(50)Y.Otani, Y.Matsuba, A.Osaka : Micro bubble actuator using photo-thermal effect : Proc.SPIE Vol.4902 , Stuttgart (2002)

(51)H.Fujiwara, Y.Otani, T.Yoshizawa : Reflection moire for high spatial resolution, Proc.SPIE Vol.4902, , Stuttgart (2002) 275-284.

(52) Hiroo Fujita, Ken Yamatan, Masayuki Yamamoto, Yukitoshi Otani, Akira Suguro, Shigeru Morokawa, Toru Yoshizawa : Three-dimensional profilometry using liquid crystal grating , Proc. SPIE Vol. 5058 (2003)51-60.

(53) Y.Otani, M. Takahashi, L.Jin, H.Kowa, N.Umeda : Image detection system for 157 nm using fluorescent glass, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, Proc.SPIE Vol.5188, San Diego (2003) 134-137.

(54) L.H.Jin, H.Kowa, Y.Otani, N.Umeda : Mueller matrix imaging polarimeter in 157nm, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, Proc.SPIE Vol.5188, San Diego (2003) 146-153.

(55) (Invited Paper) Toru Yoshizawa, Hiroo Fujita, Yukitoshi Otani, and Masayuki Yamamoto : Three-dimensional imaging using liquid crystal grating projection , Program on Algorithms, Architectures,
and Devices, Confence on Optical Information Systems , Proc. SPIE Vol. 5202 (2003) 30-37. (San Diego, USA, 2003年8月4日).

(56) N. Umeda, S. Tanaka, A. Takayanagi, Y. Otani, and H. Kowa : Development of birefringence measurement with double rotating polarization components, Proceedings of SPIE.Vol.5192, (2003)1-6.

(57) T. Numata, A. Takayanagi, Y. Otani, and N. Umeda : Laser manipulation and fixation of metal nanoparticles using optical fiber probe, Proceedings of SPIE. VOL. 5220 (2003) 66-73.


(58) T.Wakayama, Y.Otani, N.Umeda : Two-dimensional measurement of birefringence dispersion by geometric phase,University of Joensuu, Selected papers 8, ICO Topical Meeting on Polarization optics
, Polvij較vi, Finland (2003) 120-121.


(59) Y.Otani, T.Wakayama, YSakai, N.Umeda : Two-dimensional measurement of birefringence distribution for DVD pickup lens, University of Joensuu, Selected papers 8, ICO Topical Meeting on Polarization optics , Polvijvi, Finland (2003) 232-233.


(60) Y.OTANI, Y.MATSUBA, S.CHIMURA, N.UMEDA, T.YOSHIZAWA : Micromanipulator by photothermal effect, Proc.SPIE Vol. 5264, Optomechatronic Systems IV, Providence, USA (2003) 150-153.


(61) Y.Kuwano, T.Tokunaga, T.Miyazaki, Kataoka, Y.Otani : Beam shaping optics for YAG Laser by using CNC Lathe, Proc.SPIE Vol.5264, Optomechatronic Systems IV, Providence, USA (2003) 237-240.

62) M.Ebisawa, Y.Otani, N.Umeda : Microscopic birefringence imaging by the local-sampling phase shifting technique, Proc.SPIE Vol. 5462, pp.45-50, Biophotonics micro nad nano imaging, Strasbourg, France (2004) .


(63) Y.Mizutani, K.Minato, Y.Otani, N.Umeda : Modeling error of sub wavelength structure for the rigorous coupled wave analysis, 204 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).

(64) R.Kuwano T.Tokunaga, Y.Otani, N.Umeda : Liquid pressure varifocus lens, 2004 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).

(65) Y.Takeda, H.Nagasaki, A.Takayanagi, Y.Otani, Y.Iimura, N.Umeda : Direct orientation of liquid crystal molecules using an atomic force microscope nano-rubbing,, 2004 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).

(66) T.Numata, Y.Morita, Y.Otani, N.Umeda : Laser fixation of metal nanoparticles on glass substrate using CW-NIR Laser, 2004 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).

(67) T. Wakayama, Y. Otani, N. Umeda : Birefringence dispersion measurement by geometric phase shifter,  2004 ICO International Conference Optics & Photonics in technology Frontier, Chiba (2004).

(68) Toshitaka Wakayama, Yukitoshi Otani, Norihiro Umeda, Takashi Kurokawa : Real time measurement of birefringence dispersion for LCD retardation film,  21 Century COE International symposium on LCDs and Related Materials (2004) TUAT.

(69) (Invited Paper) Y.Otani, Y.Mizutani, N.Umeda, T.Yoshizawa : Two-dimensional actuator using temperature-sensitive ferrite driven by light beam, Proc. Vol. 5602, Optomechatronic Sensors, Actuators, and Control (2004) Philadelphia.

(70) (Invited Paper)  Y.Mizutani, Y.Otani, N.Umeda : Super oblique incidence interferometer by using antireflection prism with sub-wavelength structure, Proc SPIE Vol. 5633, Advanced Materials and Devices for Sensing and Imaging II (2004) Beijing.

(71) Y.Mizutani, Y.Otani, N.Umeda, T.Yoshizawa : Super oblique incidence interferometer by using antireflection prism with subwavelength structure, Proc.SPIE Vol.5533, pp.10-16 (2005) Tokyo

(72) Y.Otani, Y.Mizutani, N.Umeda : Super oblique incidence interferometer using SWS prism, Precision interferometric metrology, Proc. of American Society of Precision Engineering (2005) Middletown

(73) T.Wakayama, Y.Otani, N.Umeda : Real-time measurement for birefringence dispersion using double retarder, Proc.SPIE Vol.5888, pp.71-2 (2005) San Diego

(74) Alexander V. Tavrov, Yukitoshi Otani, Takashi Kurokawa, Mitsuo Takeda : 3D common-path interferometer: achromatic nulling of on-axial light, Proc.SPIE Vol.5905 pp.1A-6 (2005)

(75) Y.Mizutani, R.Kuwano, Y.Otani, N.Umeda, T.Yoshizawa : Three-dimensional shape measurement using focus method by using liquid crystal grating and liquid varifocus lens, Proc.SPIE 6000,60000J-1-7, Two- and Three-Dimensional Methods for Inspection and Metrology III , (2005) Boston

(76) Itaru Nishiyama, Norio Yoshida, Mizue Ebisawa, Atsuo Takayanagi, Yukitoshi Otani, Norihiro Umeda : Direct alignment of nematic liquid crystal molecule using atomic force microscope nano-rubbing, Proc.SPIE Vol.6050,Optomechatronic Micro/Nano Devices and Components , 605013(2005).


(77) Ryoichi Kuwano, Tsuyoshi Tokunaga, Yukitoshi Otani, Norihiro Umeda : Liquid pressure varifocus lens for YAG laser processing, Proc. SPIE 6048, Optomechatronic Actuators and Manipulation, Sapporo, 604805 (2005).


(78) Mizue Ebisawa, Yukitoshi Otani, Norihiro Umeda : Microscopic measurement system for birefringence and optical rotation distribution, Proc. SPIE 6048, Optomechatronic Actuators and Manipulation, Sapporo, 604807 (2005).


(79) Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro Umeda : Displacement measurement by spectro-polarization modulator, Proc SPIE Vol. 6292, Interferometry XIII: Techniques and Analysis, San Diego (2006) 629213.


(80) Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro Umeda, Toru Yoshizawa : White light displacement sensor by spectro-polarization modulator, Proc. SPIE Vol. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV, Boston, , 638205 (2006).


(81) Y. Mizutani, S. Nishimura, Y. Otani, N. Umeda : Optical driving of actuator using poly-vinylidine difluoride cantilever, Proc.SPIE Vol.6374, Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006) 637404.


(82) M. Ebisawa, Y. Otani, N. Umeda : Analysis of mechanical characteristics by birefringence microscope, Proc.SPIE Vol.6374 , Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006) 637407.


(83) Y. Otani, Y. Hirai, Y. Mizutani, N. Umeda, T.Light-driven micromanipulator and its application for 3D fabrications, Proc.SPIE Vol.6374 , Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006) 63740N.


(84) Y. Mizutani, Y. Otani, N. Umeda : Two-dimensional magnetic force actuator using temperature sensitive ferrite driven by light beam, Proc.SPIE Vol.6374 , Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006) 637405 .


(85) Kuwano, R., Mizutani, Y., Tokunaga, T., Otani, Y. : Liquid pressure varifocus lens using a fibrous actuator, Proceedings of SPIE - The International Society for Optical Engineering, 6374, , Optomechatronic Actuators, Manipulation, and Systems Control ., Boston, (2006) 63740I, .


(86) T. Wakayama, N. Asato, Y. Otani, N. Umeda : Polarization Mapping System of Viewing Angle for Optical Films I nternational Display Workshop’06 , Workshop on FPD Manufacturing, Materials and Components (FMC) (2006) Otsu pp.1015-1016.


(87) Y. Otani, T. Wakayama, N. Umeda, Takashi Kurokawa : One-Shot Mapping System of Birefringence Dispersion for Retardation Films, International Display Workshop’06 , Workshop on FPD Manufacturing, Materials and Components (FMC) (2006) Ohtsu, pp.1013-1014.


(88) (Invited Paper) Y.Otani, T.Wakayama : Birefringence dispersion measurement for advanced display materials, Optical Society of America Topical meeting OPTICAL FABRICATION AND TESTING, Rochester USA (2006 Oct.10)OFTuC5.


(89) Y.Otani, Y. Mizutani : Light-driven actuators using optical fiber and PVDF, The 1st Intersnational Symposium on Next-generatioion actuators leading beakthroughs Proceedings, 165-167 (2006) Makuhari, JP.


(90) Yukitoshi Otani, Tomohito Kuwagaito, Yasuhiro Mizutani, Norihiro Umeda : Nano-structure measurement by Mueller matrix polarimeter and RCWA 2007 SEM ANNUAL CONFERENCE & EXPOSITION ON EXPERIMENTAL & APPLIED MECHANICS(2007.6) Springfield, USA, 1-4.


(91) B.Kato, T.Wakayama, Y.Otani, N.Umeda, “Simultaneous Measurement Method of Birefringence and Optical Rotation Using Spectroscopic-Polarized Modulator,” FiO/LS/OMD 2007 Conference proceedings (2007) OSA FThN7.


(92) Yukitoshi Otani, Yasuhiro Mizutani, and Norihiro Umeda : Three-dimensional optical control of magnetic levitation by temperature sensitive ferrite, Proc. SPIE 6715, 67150L (2007) Optomechatronic Actuators and Manipulation III, Lausanne, Swizerland


(93) Y.Otani, T.Wakayama, N.Umeda,T.Yoshizawa, “Generation and consideration of vectorial vortex array,”Proc.SPIE 6715, pp67150D (2007). Optomechatronic Actuators and Manipulation III, Lausanne, Swizerland.


(94) (Invited Paper) Y.Otani, T.Wakayama : Birefringence dispersion mapping by geometric phase, Photonics Asia, Advanced Materials and Devices for Sensing and Imaging,  Beijing , China (2007,11,13). (Presentation only).


(95) Tomohito Kuwagatio, Yasuhito Mizutani, Mitsuhito Ishihara, Yukitoshi Otani, : Surface profile detection for nano-structures by Mueller, PhotoAsia, Beijing , China (2007,11,3). (Presentation only).


(96) Fmio Kobayashi,Yukitoshi Otani,Toru Yoshizawa : 3D Surface profile measurement by projection type moir? using LC grating,, Two- and Three-Dimensional Methods for Inspection and Metrology VI, SPIE Optics and Photonics 2008 (Presentation only).


(97) Yukitoshi OTANI, Takumi KIMURA, Yasuhiro MIZUTANI, Toshitaka WAKAYAMA, Toru YOSHIZAWA : Three dimensional shape measurement using liquid crystal grating scanner,, Two- and Three-Dimensional Methods for Inspection and Metrology VI, SPIE Optics and Photonics 2008 (Presentation only).


(98) Yukitoshi Otani, Tomohito Kuwagaito, Yasuhiro Mizutani : Surface profile detection with nanostructures using a Mueller matrix polarimeter , Proc.SPIE Vol: 7063, Interferometry XIV: Techniques and Analysis , 70630Y (2008). Date: 11 August 2008


(99) Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa : Moir? topography using a liquid-crystal-grating based frequency modulation technique , Proc.SPIE Vol.7063, Interferometry XIV: Techniques and Analysis , 70630O (2008). Date: 11 August 2008.


(100) Yukitoshi Otani, Toshitaka Wakayama, Kazuhiko Oka, Norihiro Umeda : Spectroscopic Mueller matrix polarimeter using four channeled spectra, FiO/LS/OMD 2007 Conference proceedings (2008) OSA, FThQ8.


(101) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa : Generation of vortex spectra based on geometric phase, FiO/LS/OMD 2007 Conference proceedings (2008) OSA, FThU5.


(102) Makoto Chujo, Yukitoshi Otani, Norihiro Umeda : Spectroscopic Mueller Matrix Polarimeter by Two Liquid Crystal Polarization Modulator , FiO/LS/OMD 2007 Conference proceedings (2008) OSA , JSuA16.


(103) Yukitoshi Otani , Toshitaka Wakayama : Two-dimensional Measurement of Birefringence Dispersion, 2008 SEM Fall Conference Celebrating the 60th Birthday of Holography (2008) 1-5.


(104) Y. Otani, Tokyo Univ. of Agriculture and Technology (Japan); Y. Bellouard, Technische Univ. Eindhoven (Netherlands) : Light-driven micro-actuators and Light-based micromanipulation tool, [7266A 101], Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008).


(105) T. Wakayama, Y. Otani, T. Yoshizawa: : Generation of vortex spectra based on geometric phase for optical tweezers, ) [7266A 107] Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008)  72660A.


72660A-1-A6 (106) Y. Mizutani, Y. Otani : Optically controlled bimorph cantilever by Poly(vinylidenedifluoride) and its application of optical actuator, [7266A 110] Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008)  72660D. 72660D1-D7 .


(107) Fumio Kobayashi ,Yukitoshi Otani ,Toru Yoshizawa : 3D Surface profile measurement by projection type moir? using LC grating, 2008 Japan Taiwan Bilateral Science; Technology Symposium, (2008/11/11) Utunomiya University pp.145~147.


(108) Yasuhiro Mizutani, Tomohito Kuwagaito, Yukitoshi Otani : Surface profile detection of nanostructures by Mueller matrix, 2008 Japan Taiwan Bilateral Science; Technology Symposium, (2008/11/11) Utunomiya University pp.136~138. 


(109) (Inivited paper) Yukitoshi OTANI, Yasuhiro MIZUTANI : Optically driven actuator and manipulator, First International Conference on Trends in Optics and Photonics (2009). 


(110) Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa : Three-dimensional surface profile measurement by projection type moir? using LC grating, irst International Conference on Trends in Optics and Photonics (2009). 


(111) (Iinivited paper) Yukitoshi Otani : Polarization Technology for 3D Surface Detection - An Approach for Nano Structure Measurement and Machine Vision, First International Conference on Trends in Optics and Photonics, Tutorial , Kolkata, India ( March 1, 2009).


(112) Yukitoshi Otani, Naoya YOSHIZAWA, Yasuhiro MIZUTANI : Paul trapping for microscopic particle and its application for crystal growth , ICMDT2009 The 3rd International Conference on Manufacturing , Machine Design and Tribology, Jeju Island, Korea, June 25-26, 2009.


(113) Yukitoshi Otani, Makoto Chujo : Spectroscopic Mueller matrix polarimeter by double liquid crystal phase modulators, Proc.SPIE 7461 (2009).


(114) Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki Amamiya, Makoto Chujo , Yukitoshi Otani : Spectroscopic Stokes polarimeter with dual rotating retarder and analyzer for optical rotation measurement, Proc.SPIE 7461(2009).


(115) Toshitaka WAKAYAMA, Yukitoshi OTANI and Toru YOSHIZAWA : Axisymmetrical Mueller matrix polarimeter, Proc.SPIE 7461(2009).


(116) Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Toru Yoshizawa : Three-dimensional profilometry based on focus method by projecting LC grating pattern, Proc.SPIE 7432 (2009) pp.743210.


(117) (Invited paper) Yukitoshi Otani : Mueller matrix polarimeter for nano-structure measurement, CLEO/PR 2009 (2009).


(118) Yasuhiro Mizutani, Uehane Yoshiyuki, Kuwagaito Tomohito, Otani Yukitoshi and Umeda Nrihiro : Detection of subwavelength structure profile by decomposition of Mueller matrix, XIX IMEKO World Congress Fundamental and Applied Metrology, p.618, Lisbon, Portgul, (2009)

(119) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa: Spectroscopic birefringence imaging microscope based on channeled spectrum technique 3rd International Conference of Asiaon Society for Precision Enginerring and Nanotechnology (2009) pp.2D-8-2975 1-4.

(120) Yasuhiro Mizutani, Yoshiyuki Uehane, Yukitoshi Otani, Norihiro Umeda: Scatterometry using rigorous coupled-wave analysis and Mueller matrix decomposition, 3rd International Conference of Asiaon Society for Precision Enginerring and Nanotechnology (2009) pp.2D-13-2136 1-4.

(121) Ryoichi Kuwano, Yasuhiro Mizutani, Tsuyoshi Tokunaga, Yukitoshi Otani : Liquid pressure varifocus lens for three-dimensional measurement, 3rd International Conference of Asiaon Society for Precision Enginerring and Nanotechnology (2009) 2P10-1-4.

(122) Yukitoshi Otani , Kobayashi Fumio, Yasuhiro Mizutani, Watanabe Shuugo, Harada Manabu and Yoshizawa Toru : Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shiffer, Proc. of SPIE, Vol.7790, p.102-107, San Diego, USA, (2010).

(123) Yasuhiro Mizutani, Tetsuo Iwata and Otani Yukitoshi : Time-resolved vibrational surface profile measurement of ultrasonic motor using stroboscopic oblique incidence interferometer, Proc. of SPIE, Vol.7855, 78550N, Beijing, China, (2010).

(124) Masanosuke TANAKA, Yoshinori NAKAJIMA, Hideyuki AMAMIYA and Yukitoshi OTANI : ERROR ANALYSIS OF OPTICAL ACTIVITY FOR STANDARDIZATION BY DUAL ROTATING POLARIMETER, 10th Internanational Symposium on Measurement and Quality Control September 5-9 (2010).

(125) Yukitoshi Otani , Satoshi Takano, Yasuhiro Mizutani : Nano-structure measurement by Mueller matrix Spectro-polarimeter 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) (2010).

(126) Yasuhiro Mizutani, Tsutsumi Akihiro and Otani Yukitoshi : Optically Driven Method for Magnetically Levitating a Diamagnetic Material Using the Photothermal Effect, ISOT 2010 International Symposium on Optomechatronic Technologies, p.A-5, Toronto, (2010
)
(127) Yukitoshi Otani, Yamabe Yasuaki and Yasuhiro Mizutani : Manipulation of Droplet and Crystal Growth by Paul Effect, ISOT 2010 International Symposium on Optomechatronic Technologies, p.SP-MNM-5, Toronto, Canada, (2010).

(128) Toshitaka Wakayama, Yukitoshi Otani, and Toru Yoshizawa:Spectroscopic topological Stokes polarimeter, Proc. of SPIE 7855, 785504 (2010)

(129) (Presentation only) Yukitoshi Otani, Toshitaka Wakayama, Masanosuke Tanaka, Makoto Chujo : Real-time monitoring of optical rotation with wavelength dependence by spectroscopic polarized modulation, Conference 7906A Optical Diagnostics and Sensing XI: Toward Point-of-Care Diagnostics Photonics West 2011 (2011)

(130) Fumio Kobayashi, Yasuhiro Mizutani, Yukitoshi Otani and Toru Yoshizawa : Uni-axial profilometry by liquid crystal digital shifter, International Conference on Optics in Precision Engineering and Nanotechnology (ICOPEN2011), Singapore, (2011).

(131) Ginya Makoto, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani : Polarization properties of PLZT under applied voltage measured by dual-rotating retarder polarimeter, International Conference on Optics in Precision Engineering and Nanotechnology (ICOPEN2011), Singapore, (2011).

(132) Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki Amemiya, Yukitoshi Otani : Dual rotating polarimeter for optical activity, International Conference on Optics in Precision Engineering and Nanotechnology (ICOPEN2011), Singapore, (2011)

(133)   (inivited paper) Yukitoshi OTANI, Fumio KOBAYASHI, Yasuhiro MIZUTANI, Manabu Harada , Toru YOSHIZAWA, : Uni-axial 3-D shape measurement by liquid crystal digital shifter, SPECIAL SYMPOSIUM ON MODERN EXPERIMENTAL METHODS IN MECHANICS, ENGINEERING, AND THE SCIENCES, ICCS2011 International Conference on Computational & Experimental Engineering and Sciences , Nanjing China (2011).

(133) (inivited paper) Yukitoshi OTANI : " Center for Optical Research and Education based on Classical Optical Technology "Forum on Optics and Laser in Engg. Singapore (2011).

(134) (inivited paper) Yukitoshi OTANI, Shogo Ishida : "Full and partial Mueller matrix polarimeter by dual photo-elastic modulator, 22nd General Congress of the International Commission for Optics (ICO), Purbra, Mexico (2011).

(135) Masanosuke Tanaka, Yoshinori Nakashima, Hideyuki Amemiya, Toshitaka Wakayama2 Yukitoshi Otani : High-speed and -accuracy measurement of optical rotation by liquid crystal modulators, SPIE Optics and Photonics 2011, Optical Manufacturing and Testing IX, San Diego ( 2011).

(136) Toshitaka Wakayama, Masanosuke Tanaka, Yoshinori Nakajima, Hideyuki Amemiya, Yukitoshi Otani : Spectorsocpic Stokes polarimeter based on dual liquid crystal modulators, SPIE Optics and Photonics 2011, Polarization Science and Remote Sensing V, , San Diego (2011).

(137) Yukitoshi OTANI, Masanosuke TANAKA, Toshitaka WAKAYAMA : Spectorsocpic Stokes polarimeter using dual liquid crystal modulators, OIE'11 - The Ninth Japan-Finland Joint Symposium on Optics in Engineering, Turku Finland (2011).

(138) Toshitaka Wakayama, Y. Otani, T. Yoshizawa : Spectroscopic birefringence mapping by channeled spectrum , 2011 BSSM/SEM International Conference on Advances in Experimental Mechanics: Integrating Simulation and Experimentation for Validation (ISEV) , Edinburgh UK (2011).

(139) Fumio Kobayashi, Yukitoshi OTANI, Toru Yoshizawa : Projection Moiré Profilometry using Liquid Crystal Digital Gratings, 10th IMEKO Symposium LMPMI (Laser Metrology for Precision Measurement and Inspection in Industry), Brawnschweig, Germany (2011).

(140) (招待)S.Ishida, Y.Otani : Mueller matrix polarimeter using dual photoelastic modulator, ISOT2011, Hong Kong, China (2011).

(142) R.Mizutani , Y.Otani : Stokes polarimeter with optical fiber probe, ISOT2011, Hong Kong, China (2011).

(143) (招待)H.Onuma, Y.Otani : H.Onuma, Y.Otani : Real-time Measurement Method for Birefringence Distribution by Dynamic Stokes PolarimeteISOT2011, Hong Kong, China (2011).

(144) (招待)Y.Otani , Yasuhiro Mizutani: Evaluation of photoalignment films by UV polarimeter, ISOT2011, Hong Kong, China (2011).

(145) (招待)Y.Otani, Shgo Ishida : Mueller Matrix Polarimeter with Full and Partial Elements by Double Photo-Elastic Modulators, 2011 Taiwan-Japan Bilateral Symposium in Nano/Bio-Photonics2011, TJBS2011, Tainan, Taiwan (2011).

(146)(プレナリー)Y.Otani : Dynamic Birefringence Mapping, IConTop 2011, Kolkata, India (2011).

(147) Takashi Ouma, Yukitoshi Otani : Dynamic birefringence mapping, Photonics Europe, Brussels, Belgium (2012).

(148) (inivited paper) Yukitoshi Otani, Takashi Onuma : Real-time birefringence mapping by dynamic Stokes polarimeter, The 2nd Special Symposium in Experimental Mechanics, Engineering , and Science in Grete, Greece (2012).

(149) (inivited paper) Yukitoshi Otani : Nano-structure inspection by dual-rotating Mueller matrix spectro-polarimeter, SEM Congress & Exposition on Experimental & Applied Mechanics, Costa Mesa, CA, USA (2012).

(150) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa : Achromatic Axially-Symmetric Wave Plate, The 8th International Conference on Optics-Photonics Design and Fabrication , ODF12, Saint Petersburg, Russia (2012).

(151) Yukitoshi Otani, Takashi Onuma : Real-time birefringence mapping by polarization high-speed image sensor, 4th International Workshop on Perspectives of Optical Imaging and Metrology - Holomet2012 , Utsunomiya(2012).

(152) Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa : An interferometric observation of topological effect by novel axially symmetrical wave plate, SPIE Optics and Photonics Conference 8493, Interferometry XVI: Techniques and Analysis, San Diego USA (2012).

(153) Yui Satake, Yukitoshi Otani and Isamu Maeda : Photosynthetic fuel cell using purple non-sulfur bacteria, International Symposium on Optomechatronic Technologies - ISOT 2012 , Paris France (2012)

(154) Yuichi Kanamori and Yukitoshi Otani : Driving droplet by photo-thermal Marangoni convection, I International Symposium on Optomechatronic Technologies - ISOT2012, Paris France (2012).

(155) Shuhei Shibata, Takashi Onuma and Yukitoshi Otani : Realtime birefringence mapping by polarization camera, International Symposium on Optomechatronic Technologies -ISOT2012, Paris France (2012).

(156) Makoto Ginya, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani : Low-voltage driven method of ferroelectric memory device using optical polarization property International Symposium on Optomechatronic Technologies -ISOT2012, Paris France (2012).

(157) Yuki Nagata, Yasuhiro Mizutani, Tetsuo Iwata and Yukitoshi Otani Photothermal imaging for single nanoparticle using near-common path interferometer International Symposium on Optomechatronic Technologies -ISOT2012, Paris France (2012).

(158) Ryota Mizutani, Yukitoshi Otani, Tomoharu Ishikawa, Miyoshi Ayama : Imaging Stokes polarimeter by dual rotating retarder and analyzer and its application of evaluation of Japanese lacquer, Photonics Asia - Optical Metrology and Inspection for Industrial Applications II Paper 8563-13, Beijing China (2012).

(158) (Inivited paper) Yukitoshi Otani, Takashi Onuma : Dynamic birefringence mapping by high-speed polarization image sensor, 2012 IUTAM symposium on advances of optical methods in experimental mechanics- Taiwan (2012).

(159) Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Toru Yoshizawa : Uniaxial 3D shape measurement by LC digital shifter, Optics in Precision Engineering and Nanotechnology (icOPEN2013). Singapore (2013).

(160) Yuichi Kanamori, Yukitoshi Otani : Driving droplet by photo-thermal Marangoni convection, ICMDT 2013 Proceedings of The 5th International Conference on Manufacturing, Machine Design and Tribology, Pusan, Korea (2013).

(161) Shuhei Shibata, Takashi Onuma, Yukitoshi Otani : Real-time birefringence mapping by full-Stokes polarization camera, 6th International Conference on Spectroscopic Ellipsometry (ICSE VI), Kyoto (2013).

(162) Ryota Mizutani, Toshitaka Wakayama, Yukitoshi Otani : Dual rotating type of generalized Stokes polarimeter, 6th International Conference on Spectroscopic Ellipsometry (ICSE VI), Kyoto (2013).

(163) Yukitoshi Otani, Shuhei Shibata, Fumio Kobayashi, Yasuhiro Mizutani, Toru Yoshizawa : Real-time uniaxial profilometry using contrast detection by polarization camera, SPIE Optics and Photonics 2013, Dimensional Optical Metrology and Inspection for Practical Applications II, San Diego ( 2013).

(164) Yuichi Kanamori, Yukitoshi Otani : Optical driving of the droplet by photo-thermal Marangoni convection, Utsunomiya (2013).

(165) David I. Serrano-Garcia, A. Martinez Garcia, N.I. Toto-Arellano, Yukitoshi Otani : Single shot phase shifting interferometry using a two interferograms phase shifting algorithm, Utsunomiya (2013).

(166) (Inivited paper) Yukitoshi Otani, Shuhei Shibata, Taakashi Onuma : Real-time Stokes mapping by polarization camera and its application to high-speed birefringence imaging, 2013 International Symposium on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).

(167) David I. Serrano-Garcia, Yukitoshi Otani, Amalia Martinez-Garcia, Noel-Ivan Toto-Arellano : Single shot phase shifting interferometry using a two-interferograms phase shifting algorithm, 2013 International Symposium on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).

(168) Yo Kamata, Jun-ichiro Sugisaka, Yukitoshi Otani, Toyohiko Yatagai : Nano-structure Evaluation using Transmission Type Spectroscopic Mueller Matrix Polarimeter and Boundary Element Method, 2013 International Symposium on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).

(169) Masahito Sakaguchi, Yukitoshi Otani : Development of a Spectroscopic Mueller matrix Microscope for Biological Samples Analysis 2013 International Symposium on Optomechatronic Technologies (ISOT2013), Jeju, Korea (2013).

(170) Takashi. Onuma, Yukitoshi. Otani : A High-speed Measurement System for Birefringence Distribution, 21st DYMAT Technical Meeting, High speed imaging for dynamic testing of materials and structures, London, UK (2013).
(171) (Inivited paper) Yukitoshi Otani, Shuhei Shibata, Takashi Onuma : Real-Time Imaging Polarimeter by Full-Stokes Polarization Camera, 2013 Japan-Taiwan Bilateral Symposium in Nano/Bio-Photonics (2013 JTBS), Hamamatsu (2013).
(172) Shuhei Shibata, Fumio Kobayashi and Yukitoshi Otani : Uniaxial three-dimensional surface measurement by polarization camera with real-time, 2013 Japan-Taiwan Bilateral Symposium in Nano/Bio-Photonics (2013 JTBS), Hamamatsu (2013).
(173) Yuichi Kanamori, Yukitoshi Otani : Optical driving of the droplet by photo-thermal Marangoni convection, 2013 Japan-Taiwan Bilateral Symposium in Nano/Bio-Photonics (2013 JTBS), Hamamatsu (2013).

(174) Toshitaka Wakayama, Kazuyuki Sakaue, Takeshi Higashiguchi, Yukitoshi Otani, Masakazu Washio, Motoki Yonemura, Toru Yoshizawa : THz Vector Beam generated by Achromatic Axially Symmetric Wave Plate, The 9th International Conference on Optics-photonics Design and Fabrication, “ODF'14, Itabashi, Tokyo” (2014).

(175) Shuhei Shibata, Takashi Onuma, Yukitoshi Otani : Spectroscopic birefringence mapping by full-Stokes polarization camera, The 9th International Conference on Optics-photonics Design and Fabrication, “ODF'14, Itabashi, Tokyo” (2014).

(176) (Inivited paper) Yukitoshi Otani, Toshitaka Wakayama : Achromatic axially symmetric wave plate and its application to radial polarization beam, International Conference on Optics & Optoelectronics, ICOL2014 (2014).

(177) Masahito Sakaguchi, Yutaka Kodama, Yukitoshi Otani : Spectroscopic Mueller Matrix Microscope Using Dual-rotating Retarders, The 1st Biomedical Imaging and Sensing Conference (BISC’14) (2014).

(178) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada, Yukitoshi Otani : Dynamic and uniaxial profilometry by polarization camera, Photonics Europe (2014).

(179) Takashi ONUMA, Yukitoshi OTANI : High-speed birefringence mapping by polarization camera and its application for film orientation tracking, SPIE Sensing Technology + Applications, Baltimore, USA (2014).

(180) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada and Yukitoshi Otani : Real-time and uniaxial measurement of 3D profile by polarization camera, SPIE Sensing Technology + Applications, Baltimore, USA (2014).

(181) Shuhei Shibata, Fumio Kobayashi, Daisuke Barada, Yukitoshi Otani : Microscopic type of real-time uniaxial 3D profilometry by polarization camera, SPIE Optics and Photonics, San Diego, USA (2014).

(182) David I. Serrano-Garcia, Amalia Martinez-Garcia, Noel-Ivan Toto-Arellano and Yukitoshi Otani : Dynamic temperature field measurements using a polarization phase shifting technique, SPIE Optics and Photonics, San Diego, USA (2014).

(183) Yukitoshi Otani, Shuhei Shibata : Real-time imaging Stokes polarimeter by polarization camera and its application to birefringence mapping, ICO 2014, Santiago de Compostela, Spain (2014).

(184) David I. Serrano-García and Yukitoshi Otani : 3-D SURFACE PROFILOMETRY EMPLOYING THE POLARIZATION PHASE SHIFTING TECHNIQUE, The International Symposium on Laser Metrology for Precision Measurement and Inspection in Industry 2014 : IMEKO, Tsukuba, Japan (2014).

(185) Yukitoshi Otani, Shuhei Shibata, Takashi Onuma : REAL-TIME MEASUREMENT OF STOKES PARAMETERS BY POLARIZATION CAMERA, 16th International Conference on Experimental Mechanics (ICEM-16), Cambridge UK (2014).

(186) (Inivited paper) Yukitoshi Otani, Shuhei Shibata : Dynamic measurement of Stokes parameters and birefringence mapping by full-Stokes polarization camera, Photonics Asia 2014 "Optical Metrology and Inspection for Industrial Applications III", Beijing , China (2014).

(187) (Inivited paper) Yukitoshi Otani, Hiroshi Hasegawa : Imaging polarimeter for spectroscopic full-Stokes parameters and its application to flaw detection, The 2014 International Coference on Photonics and Optical Engineering (icPOE) , Xi'an , China (2014).

(188) Hiroshi Hasegawa and Yukitoshi Otani : Imaging Stokes polarimeter on six-axis robot arm, International Symposium on Optomechatronic Technologies (ISOT2014), Seattle (2014).

(189) Yiheng Lim and Yukitoshi Otani : Simultaneous spectroscopic and elastographic measurement by multifunctional optical coherence tomography: Imaging Stokes polarimeter on six-axis robot arm, International Symposium on Optomechatronic Technologies (ISOT2014), Seattle (2014).

(190) (Inivited paper) Yukitoshi Otani and Shuhei Shibata : Spectroscopic full-field Stokes polarimeter, International Symposium on Optomechatronic Technologies (ISOT2014), Seattle (2014).

(191) Kaustav Bhattacharyya, David Ignacio Serrano-García, Yukitoshi Otani : Diattenuation and retardance error analysis of a Mueller matrix dual rotating retarder polarimeter, IEM OPTRONIX 2014 (2014), Korkata, India.

(192) Kaustav Bhattacharyya, David Ignacio Serrano-García, Yukitoshi Otani : Mueller Matrix Polarimeter with Diattenuation Error Calibration Approach, Advances in Optical Science and Engineering, Springer Proceedings in Physics Volume 166, 2015, pp 363-373

(193) Yukitoshi Otani, Yo Kamata, Jun-ichiro Sugisaka, Toyohiko Yatagai : Surface profile detection with nanostructures using spectroscopic Mueller matrix polarimeter and boundary element method, OPTIMESS2015 (2015) Antwarp, Bergum.

(194) Yukitoshi Otani , Shuhei Shibata, Daisuke Barada: Real-time and uniaxial microscopic measurement of 3D profile by polarization grating, SPIE Sensing Technology + Applications, Baltimore, USA (2015).

(195) David I. Serrano Garcia and Yukitoshi Otani, “Phase Sensitive Computer Tomographic Measurement using a Pixelated Phase Mask Interferometry Technique,” SPIE Optical Metrology, Munich, Germany (2015).

(196) G.A. Parra Escamilla and Y. Otani, “Development of a portable three-dimensional measurement system using stereo vision and optical flow algorithms,”5th International symposium on experimental mechanics & 9th symposium on optics in industry, Guanajuato, Mexico, (2015)

(197) Yukitoshi Otani, Hiroshi Hasegawa : Full-Field imaging for spectroscopic Stokes parameters in all directions and its application to flaw detection, SPIE Photonics and Optics, San Diego,(2015).

(198) Yukitoshi OTANI , Shuhei SH

IBATA,Tomohiro KIIRE,Yoshio HAYASAKI, Toyohiko YATAGAI :High precision Stokes polarimeter for scattered light by intensity detection with wide dynamic range, SPIE Photonics and Optics, San Diego,(2015).

(199)(招待講演)Yukitoshi Otani, Shuhei Shibata : Real-time polarization imaging by polarization camera, 5th International Symposium on Experimental Mechanics and the 9th Symposium on Optics in Industry, ISEM-SOI 2015, in Guanajuato, Mexico (2015).
(200) David I. Serrano Garcia and Yukitoshi Otani, “Computer tomography measurement using a pixelated polarizing interferometer SPIE/OSJ Biophotonics Japan, Tokyo, Japan (2015).

(201) David I. Serrano Garcia and Yukitoshi Otani, “Phase Sensitive Computer Tomographic Measurement using a Pixelated Phase Mask Interferometry Technique,” The 2nd International Conference on Opto-Electronics and Applied Optics (OPTRONIX 2015), Vancouver, Canada (2015) (2015).

(202) Shuhei Shibata, Yoshio Hayasaki, Yukitoshi Otani and Toyohiko Yatagai : High precision Stokes polarimetry for scattering light using wide dynamic range intensity detector, ISOT2015, Neuchâtel l (2015).

(203) Ryoichi Kuwano, Tsuyoshi Tokunaga, Sho Morita, Yuta Okane and Yukitoshi Otani : An Enclosed variable focusing lens for remote welding ISOT2015, Neuchâtel (2015).
(204) G.A. Parra Escamilla and Y. Otani, “3D movement analysis for NIR light using stereo vision and optical flow techniques,” The Asian CORE Student Meeting on Photonics & Optics, Osaka, Japan, (2015).

(205) Shuhei SHIBATA, Hiroshi ISHIWATA, Yukitoshi OTANI, Toyohiko YATAGAI :Real-time phase analysis by differential interference contrast microscope using pixelated polarization camera, The 2nd Biomedical Imaging and Sensing Conference (BISC’16), Yokohama, Japan (2016)

(206) David I. Serrano Garcia and Yukitoshi Otani,” Phase Sensitive CT Measurement Using a Pixelated Polarizing Shearing Interferometer,” The 2nd Biomedical Imaging and Sensing Conference (BISC’16), Yokohama, Japan (2016).

(207) Yukitoshi Otani, Hiroshi Hasegawa : Defect detection by spectroscopic Stokes imaging polarimeter. EOS Berlin, Germany (2016).

(208) Nia Natasha Tiopol, Shuichi KAWABATA, Yukitoshi OTANI: A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs, ISOT2016, Tokyo (2016).

(209) Geliztle A. Parra Escamilla, Masaru Matsuda, Masayuki Igo, Yukitoshi Otani : Movement and behavior analysis of biological samples using a near infrared imaging system, ISOT2016, Tokyo (2016).

(210) David I. Serrano-Garcia, Yukitoshi Otani : Phase sensitive CT measurement using pixelated polarizing shearing interferometer, ISOT2016, Tokyo (2016).

(211) Kaustav Bhattacharyya, Toshitaka Wakayama, Nathan Hagen, Yukitoshi Otani : Single Shot Mueller Matrix Polarimeter, ISOT2016, Tokyo (2016).

(212) Pradipta Mukherjee, Nathan Hagen, Yukitoshi Otani : Decomposition of partial Mueller matrix to measure simultaneously birefringence and depolarization characteristics in real time, ISOT2016, Tokyo (2016).

(213) Geliztle A. Parra Escamilla, Fumio Kobayashi, Yukitoshi Otani : Three-dimensional endoscopic measurement by uni-axis grating projection, Photonics Asia, Beijing (2016).

(214)Shin NINOMIYA1,Shuhei SHIBATA1, Jun-ichiro SUGISAKA2,Yukitoshi OTANI : Surface profilometry with nano-structure using spectroscopic Mueller matrix polarimeter and boundary element method, ICPE2016, Hamamatsu (2016).

(215) (招待講演)Y.Otani, S.Shibata, * H.Ishiwata, M.Matsuda, T.Yatagai : Real-time 3D reconstruction by differential interference contrast microscope using pixelated polarization camera, International Conference on Light and Light based technologies ( ICL2T-2016) Optical Society of India, Tezpur, India (2016)

(216) Geliztle A. Parra Escamilla, David I. Serrano Garcia, Yukitoshi Otan :Three-dimensional movement analysis for near infrared system using stereo vision and optical flow techniques , The 2nd Biomedical Imaging and Sensing Conference (BISC’17) Yokohama (2017).

(217) Yukitoshi Otani, Shuhei Shibata, Hiroshi Ishiwata, Masaru Matsuda, Toyohiko Yatagai : Real-time 3D optical sectioning by differential interference contrast microscope using pixelated polarization camera Optical Methods for Inspection, Characterization, and Imaging of Biomaterials, SPIE Optical Metrologoy, Much, Germany (2017).

(218) David I. Serrano-Garcia and Yukitoshi Otani : Phase sensitive CT measurement using a pixelated polarizing shearing interferometer, ICO17 International Comission for Optics, Shinjuku (2017).

(219) Nia Natasha TIPOL, Shuichi KAWABATA and Yukitoshi OTANI : A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs, ICO17 International Comission for Optics, Shinjuku (2017).

(220) Tomohisa Horiguchi, Yukitoshi Otani, Nathan Hagen : Reflection type of microscope for Mueller matrix polarimeter, ICO17 International Comission for Optics, Shinjuku (2017).

(221) Nia Natasha Tipol, Shuichi Kawabata, Yukitoshi Otani : A partial Mueller matrix polarimeter using two photoelastic modulator and polarizer pairs: Proc. of SPIE Vol. 10407 1040713-6. Proceedings Volume 10407, Polarization Science and Remote Sensing VIII; 1040713 (2017); doi: 10.1117/12.2272940, San Diego (2017).

(222) Shuhei Shibata, Shuichi Kawabata, Yukitoshi Otani : Real-time Stokes polarimeter using three polarized beam splitter, SPIE Optics and Photonics, San Diego (2017).

(223) (Plenary talk) Yukitoshi Otani : Polarization camera and its application, UEM Congress 2017, Disruptive Technology & Disruptive Innovation- A Renaissance in this Century, Bangkok, Thailand (2017).

(224) David I. Serrano-Garcia and Yukitoshi Otani : Phase sensitive CT measurement using a pixelated polarizing shearing, OIE17, Sado (2017).

(225) Yukitohi Otani, Shuhei Shibata, Nathan Hagen, Masaru Matsuda, and Toyohiko Yatagai : Differential interference contrast microscope by pixelated polarization camera, OIE17, Sado (2017).


(226) Tomohisa Horiguchi, Nathan Hagen, Yukitoshi Otani : Reflected type of Mueller matrix microscope For bio-imaging applications, IONS 2017, Okinawa (2017).

(227) (Invited paper) Yukitoshi Otani, Shuhei Shibata, Hiroshi Hasegawa : Spectroscopic Stokes imaging polarimeter for defect detection, ISOT2017, Tainan, Taiwan (2017).

(228) (Invited paper) Shuichi Kawabata, Shuhei Shibata and Yukitoshi Otani : A simple and fast Stokes polarimeter, ISOT2017, Tainan, Taiwan (2017). (229) Nia Natasha TIPOL, Shuichi KAWABATA and Yukitoshi OTANI: A partial Mueller matrix ellipsometer using two photoelastic modulator-polarizer pairs, ISOT2017, Tainan, Taiwan (2017).

(230) (Keynote Speaker)David I. Serrano-Garcia and Yukitoshi Otani : Interferometric measurements based on polarization phase shifting techniques employing a pixelated polarization sensor, International Conference on Applied Electronics (ICApplE), October (2017),

(231) Yukitoshi Otani, Tomohisa Horiguchi : Mueller matrix microscopic polarimeter for mechanical properties of bio-samples, Photomechanics 2018,Toulouse, March (2018).

(232) (Invited paper) Yukitoshi Otani : Differential interference contrast microscope and 3D reconstruction by pixelated polarization camera, 2018 Taiwan-Japan Bilateral Symposium in Optics for Intelligent Information Science & Technology: Biophotonics & Agricultural Photonics, April (2018).

(233) Isoda, Kazutaka, Yukitoshi Otani : Numerical analysis of angle-selective one-dimensional periodic structure for building energy management, Photonics Europe, Strasbourg , April (2018).

(234) Maddipatla Reddikumar, Joel Cervantes, Yukitoshi Otani, Barry Cense, "A 2.8-mm beam diameter system for retinal imaging with OCT and adaptive optics," Proc. SPIE 10711, Biomedical Imaging and Sensing Conference, 107110C (24 April 2018); doi: 10.1117/12.2319383.

(235) Isoda, Kazutaka, Yukitoshi Otani : Angle-selective reflection surface for energy efficiency, Photonics Europe, Strasbourg, April (2018).

(236) Pradipta Mukherjee, Nathan Hagen, Yukitoshi Otani, "Glucose sensing in the presence of scattering particles using decomposition of partial Mueller matrix", in Biomedical Imaging and Sensing Conference, Proceedings of SPIE Vol. 10711, 107110Y.

(237) (Keynote Speaker) Yukitoshi Otani : Real-time phase analysis of a bio sample by differential interference contrast microscope using pixelated polarization camera, icOPEN 2018, Shanghao, China May (2018.)

(238) Yukitoshi Otani, Shuhei Shibata, Hiroshi Hasegawa : Imaging Stokes polarimetry for defect detection, ICEM18, Burussell, Bergium, July (2018).

(239) Tatsuya Hinago, Mitsuhiro Ishihara, Yukihiro Otani : Appearance measurement of micro objects using linear scanning confocal surface shape measurement system, Proceedings of SPIE Vol.10749-5, Interferometry XIX(2018).

(240) David I. Serrano-García, Yukitoshi Otani : Dynamic interferometric measurements employing a pixelated polarization sensor and FFT spatial-temporal filtering techniques , Proceedings of SPIE Vol.10749-33, Interferometry XIX(2018).




3.著書

(1)大谷幸利 (共著):”3.1 光切断法の原理と応用”,光三次元計測(1)(新技術コミュニケーションズ,1993)28-37. 

(2)大谷幸利,吉澤徹(共著):”3.光ヘテロダイン干渉法”,O plus E シリーズ(2)   光ヘテロダイン技術(新技術コミュニケーションズ,1994 )55-68.

(3)電子画像学会 3次元画像調査委員会 3次元画像用語事典編集委員会編:3次元画像用語事典(新技術コミュニケーションズ,2000).

(4)大谷幸利(共著):最新光三次元計測,7.2半導体産業(朝倉書店,2006)92-97.(5) Yukitoshi Otani, Farrokh Janabi-Sharifi : Proceedings of SPIE 6374 Optomechatronic Actuators, Manipulation, and Systems Control (SPIE, 2006).


(6)大谷幸利(共著):光学用透明樹脂における材料設計と応用技術,第6章第1節屈折率の評価(技術情報協会,2007)301-314.


(7)大谷幸利 (共著):”第5章 縞解析法”,三次元工学2 光三次元・産業への応用(アドコムメディア,2007)146-166.


(8)Yves Bellouard, Yukitoshi Otani, Kee S. Moon, Editors , Proceedings of SPIEVolume 6715 -- Optomechatronic Actuators and Manipulation III (October 2007, SPIE).


(9) Yukitoshi Otani,Yves Bellouard Editors , Proceedings of SPIEVolume 7266 Optomechatronic Actuators and Manipulation IV, ISOT 2008 (2008).


(10) Yukitoshi Otani : Handbook of Optical Metorology, Principles and Applications, Ed.T.Yoshizawa (CRC Press, 2009) Chapter26 Birefringence Measurement, 615-630.


(11)大谷幸利(共著): 光学材料の屈折率制御の最前線,第2編第3章 液晶ディスプレイ2次元複屈折計測(シーエムシー出版,2009)64-74.


(12)大谷幸利: 第2編第5章5節 「光駆動による次世代ナノ・マイクロアクチュエータの開発」,樋口俊郎,大岡 昌博 編 アクチュエータ研究開発の最前線(エヌ・ティー・エス,2011年8月)486-491.

(13 )George K. Knopf, Yukitoshi Otani 編著: Optical Nano and Micro Actuator Technology (CRC Press, 2012) 639 Pages.

(14) Yasuhiro Mizutani, Yukitoshi Otani:8. Ellipsometry at the Nanostructure, Ellipsometry at the Nanoscale (Losurdo, Maria; Hingerl, Kurt (Eds.), Springer, 2013) 313-324.

(15) Yukitoshi Otani : Chapter 11 Uniaxial 3D Shape Measurement, Handbook of 3D Machine Vision, 275-284 (Song Zhang (Ed.) , CRC press, 2013,3).

(16) 大谷幸利:「45. 偏光素子」pp.186-188,「59.偏光計測」pp239-242, 黒田和男,荒木敬介,大木裕史,武田光夫,森伸芳,谷田貝豊彦 編;光学技術の事典(朝倉書店,2014)

4.解説記事

(1)大谷幸利,吉澤徹:光ヘテロダイン干渉計測技術,O plus E,150 (1992)85.

(2)吉澤徹,大谷幸利:変革期に見る産業用イメージセンサ,映像情報,2(1996)29-32.・lt;/P>

(3)吉澤徹,梅田倫弘,大谷幸利:研究室紹介 東京農工大学機械システム工学科,レーザ協会誌,21,3(1996)68-74.

(4)大谷幸利:文献抄録”フラットテストのための格子干渉計”,光学,26,7(1997)388.

(5)大谷幸利:文献抄録”音響光学ドーブプリズムを用いた機械的な機構をもたない画像回転”,光学,26,12(1997)702.

(6)大谷幸利,吉澤徹:位相シフト法による二次元複屈折測定,光学, 27,12(1998)698-703.

(7)大谷幸利:文献抄録”構造化された光線を用いた光学顕微鏡におけるオプティカル・セクショニング法”,光学,28,2(1999)106.

(8)大谷幸利:”1998年光学界の進展 9. 干渉計測”,光学,28,4(1999)171-181.

(9)吉澤徹,大谷幸利:2次元複屈折分布測定技術,光アライアンス,9(1999)1-4.

(10)大谷幸利:光駆動走行マシン,光アライアンス,10(1999)40-42.

(11)大谷幸利:文献抄録”マイクロストラクチャー線幅計測のための位相シフト偏光干渉計”,光学,28,11(1999)636.

(12)大谷幸利,吉澤徹:位相シフト干渉法による高精度表面形状計測,O plus E,22,5 (2000)601-607.

(13)大谷幸利,吉澤徹:低コヒーレンス干渉計を用いた偏光情報測定,光学 ,29,10(2000)602-607.

(14)大谷幸利 他:リサーチアンドアナリシス「表面形状検査技術」光産業振興協会オプトニューズ,122, 2(2001)18-20.

(15)大谷幸利:国際会議リポート「Photonics 2000」光産業振興協会オプトニューズ,122, 2(2001)47-48.

(16)新井泰彦,大谷幸利,吉澤徹:フォトニクス技術における新原理と要素技術に関する調査分科会の紹介,精密工学会誌,68,8(2002)1013-1015.

(17)大谷幸利:複屈折分布によるディスク検査,レーザ協会誌,27,3,4(2002)62-69.

(18)大谷幸利:総論:偏光・複屈折計測における最近の話題,O plus E,25,11 (2003)1220-1225.

(19)大谷幸利:液晶デバイスと製造評価,精密工学会誌,70, 5(2004)598-601.

(20)若山俊隆,大谷幸利:幾何学的位相とその光計測への応用,光アライアンス,15, 7(2004)33-37.

(21)大谷幸利:高岳レビュー,巻頭言(2005).

(22)大谷幸利:研究室紹介大谷研究室,精密工学会誌,71, 6(2005).

(23)大谷幸利:特集のポイント:偏光技術の新たな展開:偏光計測から光駆動まで,O plus E,29,1 (2007)20-22.

(24)若山俊隆,吉澤徹,大谷幸利:分光偏光変調による光計測の高機能化,O plus E,29,1 (2007)36-40.

(25)藤田宏夫,水谷康弘,大谷幸利,吉澤徹:液晶格子による光切断を用いた三次元形状計測,光アライアンス,19,7 (2008) p.41-44..

(26)大谷幸利:光学素子の偏光・複屈折問題とその評価法,レーザ協会誌,33,2(2008)pp.14-21.

(27)大谷幸利:創立100年を目指して,高岳レビュー, 172, (2008)

(28)大谷幸利:特集のポイント:身近な安全を支える光技術,O plus E,31, 7 (2009)742-743.

(29)大谷幸利:液晶フィルムの偏光計測法,液晶(日本液晶学会誌),13, 4 (2009)273-281.

(30)大谷幸利:財団法人 光産業技術振興協会,国際会議速報 国際会議速報H21-No.20 - 第6分野 加工・計測,SPIE Optics+Photonics 2009 ショート速報 [加工・計測関連], (2009)インターネット版

(31) 大谷幸利,若山俊隆:分光偏光変調を用いたミュラー行列測定,光学,39,8 (2010) 385-391.

(32) 大谷幸利:偏光解析と干渉計測 ,オプトロニクス, 29,8 (2010) 111-116.

(33) 大谷幸利:ミュラー行列偏光計 ,光技術コンタクト, 48, 3 (2010) 104 -108.

(34) 大谷幸利:特集のポイント光で/を動かす技術, O plus E, 32, 5 (2010) 517-518.

(35)大谷幸利:コラム・日本縦断研究室巡り 宇都宮大学 オプティクス教育研究センター,レーザ協会誌,37,2(2012)pp.39-42.

(36) 大谷幸利:光駆動ナノ・マイクロマシン, 応用物理学会誌, 82, 1 (2013) 33-36.

(37) 大谷幸利:偏光技術とその応用, O plus E, 35, 1 (2013) 33 -34.

(38)大谷幸利:光と画像2013年:回顧,展望と大予測:偏光技術とその応用,O plus E,35,1 (2013)33-34.

(39)大谷幸利:分光ミュラー行列偏光計,表面科学,35 , 9 (2014)510-515.

(40)大谷幸利:光学素子計測についての技術動向と展望,精密工学会誌,80, 6(2014)501-505.

(41)大谷幸利:3次元計測技術,日本画像学会誌,53 , 2 (2014)128-135.

(42)大谷幸利:最近の三次元計測技術の最新動向,画像ラボ, 11(2014)42-48.


5.特許

(1)光アイソレータ,平成3年4月.


(2)光アイソレータ,平成3年4月.


(3)"Optical isolator device having a wider cutoff wavelength band for a return light beam" UnitedStates Patent No.5375009
(1994) .

(4)非接触三次元形状計測装置,特願平 5 - 123884 .


(5)表面形状測定装置,特願平 6-123843.


(6)表面状態測定方法,特願平 8-07313993.


(7)斜入射干渉計,(平成6年074219 ).


(8)3次元形状測定システム(平成6年049145 )


(9)ディスク基板の内部応力状態の測定法(特願2000-35820)


(10)表面形状測定装置(特願平2000-229907)


(11)波長依存性を考慮した複屈折測定装置及び方法,(特願平2001-373232)


(12)表面形状測定装置 出願番号:特願平2000-229907 出願日:平成12年7月28日


(13)特願平2001-373232 波長依存性を考慮した複屈折測定装置及び方法


(14)特願2004-050991:複屈折分散計測装置および複屈折分散計測方法 


(15)複屈折特性装置および複屈折特性測定方法、特願2004-070216.


(16)特開2001-141602 複屈折評価装置および複屈折評価方法


(17)特開2001-141522 光学式エンコーダ


(18)特開2000-065549 非球面鏡の形状測定方法および形状測定装置


(19)特開平11-257930 三次元形状測定装置


(20)特開平11-083454 格子パターン投影法を用いた3次元形状測定装置


(21)特開平09-152318 表面状態測定方法


(22)特開平07-332956 表面形状測定装置


(23)特開平07-260451 3次元形状測定システム


(24)特開平07-260420 斜入射干渉計


(25)特開平06-331329 非接触三次元形状計測装置


(26) 偏光状態測定装置,円二色性測定装置及びその方法,特願2005-280367.


(27)特性計測装置及び計測方法,特願2005-172848.


(28)複屈折特性測定装置および複屈折特性測定方法,特願2004-070216.


(29)複屈折特性計測装置及び計測方法,特願2005-92525.


(30)複屈折分散計測装置および複屈折分散計測方法,特願2004-050991.


(31)三次元磁気浮上装置、および永久磁石の三次元浮上方法, 特願2007-045687  公開番号2008-211901


(32)光学特性計測装置及び光学特性計測方法,特願2006-054182,公開番号2007-232550


(33)計測装置及び計測方法,特願PCT/JP2007/052844,公開番号WO2007/099791


(34)計測装置及び計測方法,特願12/224491公開番号:WO2007/099791


(35)計測装置及び計測方法,特願20087022194,公開番号WO2007/099791


(36)計測装置及び計測方法,特願2008-502703,公開番号WO2007/099791


(37)光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット,特願PCT/JP2007/055355,公開番号WO2007/111159


(38)光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット,特願12/225384,公開番号WO2007/111159


(39)光学特性計測装置及び光学特性計測方法、並びに、光学特性計測ユニット,特願2008-507432,公開番号WO2007/111159


(40)光特性計測装置及び光特性計測方法,特願2005-337614,公開番号2007-139772


(41)計測装置及び計測方法、並びに、特性計測ユニット,特願PCT/JP2006/326056,公開番号WO2007/080790


(42)計測装置及び計測方法、並びに、特性計測ユニット,特願番12/087663,公開番号WO2007/080790


(43)計測装置及び計測方法、並びに、特性計測ユニット,特願2007-553876,公開番号WO2007/080790


(44)光学特性計測装置及び光学特性計測方法,出願番号PCT/JP2006/311615,公開番号WO2006/134840


(45)光学特性計測装置及び光学特性計測方法,出願番号11/922006,公開番号WO2006/134840


(46)光学特性計測装置及び光学特性計測方法,出願番号特願2006-54153,公開番号200714891


(47)光学特性計測装置及び光学特性計測方法,出願番号2007-521264,公開番号WO2006/134840


(48)三次元形状計測装置および三次元形状計測方法,出願番号2005-347575,公開番号2007-155379


(49)光学特性計測装置及び光学特性計測方法,出願番号11/887410,公開番号WO2006/103953


(50)光学特性計測装置及び光学特性計測方法,出願番号007-510390,公開番号WO2006/103953


(51)光学特性計測装置および方法,出願番号2006-116844,公開番号2007-286011


(52)偏光状態測定装置、円二色性測定装置及びその方法,出願番号2005-280367,公開番号2007-093289


 


6.招待講演


(1) 大谷 幸利:キーノートスピーチ:光による形状計測,精密工学会秋季学術講演会 北海道大学 (1998).


(2) Y.Otani : "Moire topography with sensitivity of sub-micrometer" Seminar, Center for Optics Manufacturing (COM) Univ.of Rochester, 24th July (1998).


(3) 大谷 幸利:内部情報をとらえる-複屈折からのアプローチ-,光交流会 第129回オプトフォーラム ,ココリサーチホール11月17日(1999).


(4) 大谷 幸利:二次元複屈折分布の計測技術,三次元工学研究会 ,パシフィコ横浜会議センター 12月1日(1999).


(5) 大谷 幸利:ディスクの表面および内部状態の光学的測定法,プラスチック成型加工学会 第51回講演会 4月21日(2000).


(6)大谷 幸利:イントロダクトリートーク「最近の格子パターン投影法を用いた形状計測」,平成12年度日本光学会北陸信越講演会,新潟大学11月1日(2000)


(7) Y.Otani : Lecture "Three dimensional shape measurement using grating projection method", Calcutta University, 21th December (2000).


(8)大谷幸利:「先端メカトロニクス技術のための光技術」TAMA産学連携フェスタin 狭山,2月7日(2001).


(9) 大谷幸利:「偏光測定のための干渉計測技術」2001-1光センシング技術部会,(社)日本オプトメカトロニクス協会,6月14日,機械振興会館(2001).


(10) 大谷幸利:複屈折測定によるディスクの検査,レーザ計測技術の最近の動向,レーザ協会,1月25日,中央大学駿河台記念館(2002).


(11) 大谷幸利:2次元複屈折分散計測法,計測自動制御学会北海道支部講演会,3月22日,北海道大学(2002).


(12) 大谷幸利:偏光の基礎と回折光学への展望,オプティカルソリューションズセミナー,5月17日,港区勤労福祉会館(2002).


(13)大谷幸利 :長野県精密工業試験場 平成14年度技術交流プラザ「製品検査のためのセンシング技術の研究」分科会(第8回)「光応用計測の現状と応用~表面形状から内部情報まで~」,長野県精密工業試験場(2003年2月26日).


(14) 大谷幸利:大学発ニューテクノロジー研究・開発・ベンチャー」No.2 液晶ディスプレイのための2次元複屈折分散計測, IGAS2003 印刷機材団体協議会,東京ビックサイト(2003年9月23日).


(15)大谷 幸利:偏光分光干渉による2次元複屈折分散計測法,平成15年度日本光学会北陸信越講演会,新潟大学11月7日(2003).


(16)大谷 幸利:偏光分光干渉による2次元複屈折分散計測法,第7回光波シンセシス研究会11月20日(2003).


(17)大谷幸利:(キーノート)メカノフォトニクスにおける光駆動技術,精密工学会秋季学術講演会 (2004)


(18)Y.Otani : Moir? and Fringe Projection Systems, Science & Technology school on Diffractive Optics and Optical Metology(University of Calcutta) 2006/ 12/ 28 Calcutta University, Kolkata, India


(19)大谷幸利 : 分光偏光変調による分光偏光・複屈折イメージング応物,2007年春季第54回応用物理学関係連合講演会シンポジウム「分光センシング技術の新たな活用と展開」(2007).(3月28日 青山学院大学)


(20)大谷幸利:実用化のための偏光・複屈折評価法 ~液晶用光機能性高分子フィルムへの応用~,精密工学会秋季大会シンポジウム「最先端の光計測」(9月12日 旭川勤労福祉会館)(2007).


(21)大谷 幸利:縞解析法のナノ計測への応用,光応用技術シンポジウム Senspec2008 (2008/6/12 パシフィコ横浜).


(22)Y.Otani : The Department of Mechanical Engineering/College of Engineering and Applied Sciences, Stony Brook University, Mechanical Engineering Seminar : Research at the Optomechatoronics Lab., Tokyo University of Agriculture and Technology, Japan.Friday, October 24, 2008, 2:30 PM, Room 231 Engineering Building.


(23)大谷 幸利 :分光ミュラー行列イメージング,応用光学懇談会第137回講演会 (2009/1/9) 大阪・島津マルチホール.


(24) 大谷 幸利 :フォトサーマル効果を用いた光駆動アクチュエータ,レーザ学会学術講演会第29回年次大会(2009/1/11)徳島大学.


(25) 大谷 幸利::分光ミュラー行列偏光計とその応用,第56回応用物理学関係連合講演会シンポジウム「偏光計測の基礎と応用最前線」(2009)(3月30日 筑波大学).


7.新聞掲載


(1)朝日新聞の2014年6月17日「子供光教室ー光学の世界への招待」

(2)読売新聞の2014年6月20日「子供向け光教室」

(3)東京新聞の2015年1月14日「光学で国際交流を」